IP Library Granted Patent US 7,889,909
Granted Patent B2
US 7,889,909 · App. 11/723,577 · Granted Feb 15, 2011

Pattern matching method and pattern matching program

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Quick Facts
Patent No.
US 7,889,909
App. No.
11/723,577
Granted
Feb 15, 2011
Kind
B2
Abstract

It is an object of the invention to provide a suitable method for identifying depression/protrusion information in a design data; and a program and an apparatus for the same; for example, even in the case that similar portions are arranged, to provide a method for enabling a pattern matching with high precision between the design data and an image obtained by an image formation apparatus or the like; and a program and an apparatus for the same. To attain the above object, a pattern matching method, wherein, using information concerning a depression and/or a protrusion of the pattern on the design data, or a pattern portion and/or a non-pattern portion on the design data, pattern matching is executed between the pattern on the design data and the pattern on said image; and a program for the same are provided.

Claims (22)

1. A pattern matching method for executing matching between a pattern of a design data, and a pattern on an image obtained by an image formation apparatus, comprising steps of;

adding identification information of lines onto contour lines of pattern to said design data;

obtaining center positions of edges of pattern of said design data added with said identification information and pattern on said image; and

carrying out pattern matching such that said obtained center positions coincide with each other.

2. The pattern matching method according to claim 1 , wherein the identification information of lines added with contour lines of pattern of said design data is expressed by a vector.

3. The pattern matching method according to claim 1 , further comprising steps of:

expressing degree of coincidence of said center positions as a score;

obtaining a peak of said expressed score; and

carrying out pattern matching between pattern on said design data added with said identification information and center position of edge of pattern on said image in accordance with the closest peak, when a plurality of peaks are detected.

4. The pattern matching method according to claim 3 , further comprising:

in accordance with identification information of said pattern added with at least two lines, among said contour lines on said design data, judging on whether the region defined by said two lines generated from pattern of said design data is depression, non-pattern portion or protrusion, pattern portion.

5. A non-transitory computer readable medium having instructions embodied thereon, execution of the instructions to cause a computer to carry out functions for pattern matching between a pattern of a design data and a pattern on an image obtained by an image formation apparatus, the functions including;

adding identification information of lines onto contour lines of pattern to said design data;

obtaining center positions of edges of pattern of said design data added with said identification information and pattern on said image; and

carrying out pattern matching such that said obtained center positions coincide with each other.

6. The computer readable medium according to claim 5 , wherein the identification information of lines added with contour lines of pattern of said design data is expressed by vector.

7. The computer readable medium according to claim 5 , wherein the functions further comprise:

expressing degree of coincidence of said center positions as a score;

obtaining a peak of said expressed score; and

carrying out pattern matching between pattern of said design data added with said identification information and center position of edge of pattern on said image, in accordance with the closest peak, when a plurality of peaks are detected.

8. The computer readable medium according to claim 7 , wherein the functions further comprise:

in accordance with identification information of said pattern added with at least two lines, among said contour lines of said design data, judging on whether the region defined by said two lines generated from pattern on said design data is depression, non-pattern portion or protrusion, pattern portion.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 21, 2007
From: SHINDO, HIROYUKI; SUGIYAMA, AKIYUKI; SUTANI, TAKUMICHI; MOROKUMA, HIDETOSHI; KOMURO, HITOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 019125/0532 →