Charged particle beam device and sample observation method in charged particle beam device

1. A charged particle beam device comprising:

an electron gun that generates an electron beam;

an imaging lens system that forms an image of the electron beam passing through a sample;

a splitting unit that splits the electron beam passing through the imaging lens system into a first image component and a second image component;

a first image detection unit that detects the first image component and outputs a first image;

a second image detection unit that detects the second image component and outputs a second image;

a processing unit; and

a display unit,

wherein a magnification of the second image is larger than a magnification of the first image,

the processing unit generates a third image by composing the first image with the second image, and

the display unit displays the second image and the third image.

2. The charged particle beam device according to claim 1 ,

wherein the processing unit generates the third image by reducing the second image and embeds the reduced image in the first image.

3. The charged particle beam device according to claim 2 ,

wherein the display unit performs display by forming a frame at a boundary between the reduced image and the first image.

4. The charged particle beam device according to claim 2 ,

wherein the processing unit changes a contrast in the vicinity of a boundary between the reduced image and the first image to a predetermined value.

5. The charged particle beam device according to claim 4 ,

wherein the splitting unit is a first scintillator in which an opening is formed,

the first image component is light from the first scintillator,

a second scintillator for detecting the electron beam passing through the opening is further included, and

the second image component is light from the second scintillator.

6. The charged particle beam device according to claim 5 ,

wherein an end surface that prescribes the opening in a cross section of the first scintillator is tilted so that extended lines of the end surface cross an optical axis of the electron beam above the scintillator.

7. The charged particle beam device according to claim 6 ,

wherein the end surface is not photosensitive with respect to the electron beam.

8. The charged particle beam device according to claim 1 ,

wherein the processing unit generates the third image by changing a contrast in the vicinity of a boundary between the first image and the second image to a predetermined value.

9. The charged particle beam device according to claim 1 ,

wherein the splitting unit is a first scintillator in which an opening is formed,

the first image component is light from the first scintillator,

a second scintillator for detecting the electron beam passing through the opening is further included, and

the second image component is light from the second scintillator.

10. The charged particle beam device according to claim 9 ,

wherein an end surface that prescribes the opening in a cross section of the first scintillator is tilted so that extended lines of the end surface cross an optical axis of the electron beam above the scintillator.

11. The charged particle beam device according to claim 9 ,

wherein the end surface that prescribes the opening in the cross section of the first scintillator is not photosensitive with respect to the electron beam.

12. The charged particle beam device according to claim 1 ,

wherein the processing unit generates the third image by magnifying the first image and embeds the second image in the magnified image.

13. The charged particle beam device according to claim 1 ,

wherein the third image is created after calculating an average value of differences or ratios of density values of pixels positioned at a boundary between a fourth image obtained by reducing the second image after duplication and the first image and adjusting the contrast of the first image and/or the fourth image by using the average value.

14. The charged particle beam device according to claim 1 ,

wherein a scintillator in which a fluorescent material is applied to a surface of an opaque substrate is used as a projection plane of the second image component, and

the second image detection unit detects the second image component from an upper side of the scintillator to output the second image.

15. A charged particle beam device comprising:

an electron gun that generates an electron beam;

an imaging lens system that forms an image of the electron beam passing through a sample;

a mirror in which an opening is formed, which splits the electron beam passing through the imaging lens system into a first image component reflected on the mirror and a second image component passing through the opening;

a first image detection unit that detects the first image component and outputs a first image;

a second image detection unit that detects the second image component and outputs a second image;

a processing unit; and

a display unit,

wherein a magnification of the second image is larger than a magnification of the first image,

the processing unit generates a third image by composing the first image with the second image, and

the display unit displays the second image and the third image.

16. The charged particle beam device according to claim 15 ,

wherein the third image is created after calculating an average value of differences or ratios of density values of pixels positioned at a boundary between a fourth image obtained by reducing the second image after duplication and the first image and adjusting the contrast of the first image and/or the fourth image by using the average value.

17. The charged particle beam device according to claim 15 ,

wherein a scintillator in which a fluorescent material is applied to a surface of an opaque substrate is used as a projection plane of the second image component, and

the second image detection unit detects the second image component from an upper side of the scintillator to output the second image.

18. A charged particle beam device comprising:

an electron gun that generates an electron beam;

an imaging lens system that forms an image of the electron beam passing through a sample;

a half mirror or a beam splitter that splits the electron beam passing through the imaging lens system into a first image component as reflected light and a second image component as transmission light;

a first image detection unit that detects the first image component and outputs a first image;

a second image detection unit that detects the second image component and outputs a second image;

a processing unit; and

a display unit,

wherein a magnification of the second image is larger than a magnification of the first image,

the processing unit generates a third image by composing the first image with the second image, and

the display unit displays the second image and the third image.

19. The charged particle beam device according to claim 18 ,

wherein the third image is created after calculating an average value of differences or ratios of density values of pixels positioned at a boundary between a fourth image obtained by reducing the second image after duplication and the first image and adjusting the contrast of the first image and/or the fourth image by using the average value.

20. The charged particle beam device according to claim 18 ,

wherein a scintillator in which a fluorescent material is applied to a surface of an opaque substrate is used as a projection plane of the second image component, and

the second image detection unit detects the second image component from an upper side of the scintillator to output the second image.

21. A sample observation method in a charged particle beam device including an electron gun that generates an electron beam, an imaging lens system that forms an image of the electron beam passing through a sample, a splitting unit that splits the electron beam passing through the imaging lens system into a first image component and a second image component, a first image detection unit that detects the first image component and outputs a first image, a second image detection unit that detects the second image component and outputs a second image, a processing unit and a display unit, the method comprising the steps of:

in a case where a magnification of the second image is larger than a magnification of the first image,

generating a third image by composing the first image with the second image by the processing unit; and

displaying the second image and the third image on the display unit.

22. The sample observation method in the charged particle beam device according to claim 21 ,

wherein the processing unit generates the third image by reducing the second image and embeds the reduced image in the first image.

23. The sample observation method in the charged particle beam device according to claim 22 ,

wherein the display unit output an image by forming a frame at a boundary between the reduced image and the first image.

24. The sample observation method in the charged particle beam device according to claim 22 ,

wherein the processing unit changes a contrast in the vicinity of a boundary between the reduced image and the first image to a predetermined value.

25. The sample observation method in the charged particle beam device according to claim 21 ,

wherein the third image is created after calculating an average value of differences or ratios of density values of pixels positioned at a boundary between a fourth image obtained by reducing the second image after duplication and the first image and adjusting the contrast of the first image and/or the fourth image by using the average value.

26. The sample observation method in the charged particle beam device according to claim 21 ,

wherein the second image detection unit detects the second image component projected on a scintillator in which a fluorescent material is applied to a surface of an opaque substrate from an upper side of the scintillator to output the second image.