Examination device
The present invention provides an inspection device that is capable of detecting foreign matter with high accuracy, the inspection device including: a light source; an electro-optic element on which light from the light source is incident and which changes a phase of the light into at least two states; and a controller. The controller corrects a phase fluctuation of the electro-optic element itself, using intensity modulation characteristics of the eletro-optic element which are obtained by changing an applied voltage that is input to the electro-optic element.
1. A semiconductor inspecting device comprising:
an illumination optical system that includes
a laser beam source;
an electro-optic element on which a laser beam from the laser beam source is incident;
a polarization beam splitter on which the laser beam transmitted through the electro-optic element is incident; and
a shutter that is provided on an optical path of the laser beam transmitted through the polarization beam splitter,
wherein, when the shutter is closed intensity modulation characteristics of the illumination optical system are acquired with respect to a voltage applied to the electro-optic element, and
wherein the illumination optical system is corrected based on the acquired intensity modulation characteristics, such that an illumination beam having a first intensity and an illumination beam having a second intensity that is higher than the first intensity are outputted from the illumination optical system, and an inspection of a specimen is performed in a state in which the shutter is opened.
2. The semiconductor inspecting device according to claim 1 ,
wherein, during the correction, a phase fluctuation of the electro-optic element itself is corrected, based on the acquired intensity modulation characteristics.
3. The semiconductor inspecting device according to claim 1 ,
wherein, during the correction, an intensity of the laser beam from the laser beam source is adjusted.
4. A semiconductor inspecting device comprising:
a stage for mounting a specimen;
a detection unit; and
an illumination optical system comprising
a laser beam source;
a polarization beam splitter;
an electro-optic element on an optical path between the laser beam source and the polarization beam splitter; and
a shutter which can be opened and closed,
wherein, when the shutter is closed, intensity modulation characteristics of the illumination optical system are acquired with respect to a voltage applied to the electro-optic element,
wherein, when the shutter is closed, the illumination optical system is corrected based on the acquired intensity modulation characteristics, such that the illumination optical system is able to output an illumination beam having a first intensity and an illumination beam having a second intensity that is higher than the first intensity, and
wherein, when the shutter is opened, an inspection of the specimen is performed.
5. The semiconductor inspecting device according to claim 4 ,
wherein, during said correction of the illumination optical system, a phase fluctuation of the electro-optic element itself is corrected, based on the acquired intensity modulation characteristics.
6. The semiconductor inspecting device according to claim 4 ,
wherein, during said correction of the illumination optical system, an intensity of a laser beam from the laser beam source is adjusted.
7. The semiconductor inspecting device according to claim 4 ,
wherein, when the shutter is closed, the shutter blocks a laser beam from the laser beam source through the polarization beam splitter.