Charged particle beam apparatus
View Patent ↗A charged particle beam apparatus for obtaining information of an uneven surface or a depression/protrusion of a sample by irradiating a charged particle beam to a sample having an uneven surface or a depression/protrusion at a plurality of focal positions, measuring signal emitted from the sample, and comparing profile waveforms corresponding to edge portions of the uneven surface.
1. A method for determining a convex or a concave part of a sample by detecting charged particles emitted from the sample by scanning a charged particle beam, comprising:
changing a focus position of the charged particle beam;
forming a plurality of line profiles, each line profile including a plurality of peaks which indicates an edge part located between a convex or concave part of the sample and the adjacent surface, at the different focus positions;
calculating, for different focus lengths, a plurality of first width values between one peak and an adjacent peak on one side;
calculating, for different focus lengths, a plurality of second width values between the one peak and an adjacent peak on the other side;
comparing a first value among the plurality of first width values, and a second value among the plurality of second width values;
determining that the convex part is located on the one side of the one peak when the first value is smaller at a longer focus length than the second value; and/or
determining that the concave part is located on the one side of the one peak when the first value is smaller at a shorter focus length than the second value.
2. The method according to claim 1 , wherein the detection of the charged particles is performed on at least two focal positions, and a signal based on the detected charged particles is used to determine the convex or the concave part of the sample.
3. A method for determining a convex or a concave part of a sample by detecting the charged particles emitted from a sample by irradiation of a charged particle beam emitted from a charged particle source and determining the uneven surface of the sample based on the detection of the charged particles, wherein:
a plurality of determinations are performed by the method for determining a convex or a concave part of a sample according to claim 1 .
4. A sample measuring method for detecting the charged particles emitted from a sample by irradiation of a charged particle beam emitted from a charged particle source, wherein the sample is measured according to the focal position when a value subjected to measurement used for the determination of a convex or a concave part of a sample according to claim 1 becomes minimum.
5. A charged particle beam apparatus, comprising:
a charged particle source,
a scanning deflector for scanning a charged particle beam emitted from the charged particle source on a sample,
a lens for changing a focus position of the charged particle beam emitted from the charged particle source,
a detector for detecting charged particles emitted from the sample, and
a computing section for processing a signal based on the detected charged particles, wherein the computing section:
forms a plurality of line profiles, each line profile including a plurality of peaks which indicates an edge part located between a convex or concave part of the sample and the adjacent surface, at the different focus positions;
calculates, for different focus lengths, a plurality of first width values between one peak and an adjacent peak on one side;
calculates, for different focus lengths, a plurality of second width values between the one peak and an adjacent peak on the other side of the one peak;
determines that the convex part is located on the one side of the one peak when the first value is smaller at a longer focus length than the second value; and/or
determines that the concave part is located on the one side of the one peak when the first value is smaller at a shorter focus length than the second value.
6. The charged particle beam apparatus according to claim 5 , wherein:
a template for specifying the convex or concave part of the sample and the measured results of the convex or concave part are compared to determine a state of the convex or concave part of the sample.
7. The charged particle beam apparatus according to claim 5 , further comprising a means for displaying by superimposing the convex or concave part information of the sample on the photographed image as a profile waveform.
8. The charged particle beam apparatus according to claim 5 , wherein the obtained convex or concave part information is used to specify the position of the sample.
9. The charged particle beam apparatus according to claim 5 , wherein an image or value obtained when autofocusing is used to calculate a signal or profile waveform used for determination.
10. The charged particle beam apparatus according to claim 5 , wherein a convex or concave part of the scanned portion is determined, and pattern matching is performed according to the results of the convex or concave part determination.
11. A non-transitory computer readable medium having executable instructions stored thereon for determining a convex or a concave part of a sample by detecting charged particles emitted from the sample by scanning of a charged particle beam, which when executed by a computer cause the computer to perform a method comprising steps of:
changing a focus position of the charged particle beam;
forming a plurality of line profiles, each line profile including a plurality of peaks which indicates an edge part located between a convex or concave part of the sample and the adjacent surface, at the different focus positions;
calculating, for different focus lengths, a plurality of first width values between one peak and an adjacent peak on one side;
calculating, for different focus lengths, a plurality of second width values between the one peak and an adjacent peak on the other side;
comparing a first value among the plurality of first width values, and a second value among the plurality of second width values;
determining that the convex part is located on the one side of the one peak when the first value is smaller at a longer focus length than the second value; and/or
determining that the concave part is located on the one side of the one peak when the first value is smaller at a shorter focus length than the second value.
12. A method for determining a convex or a concave part of a sample by detecting charged particles emitted from the sample by scanning a charged particle beam, comprising:
changing a focus position of the charged particle beam to a first position by performing an auto focus;
forming a first line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on the charged particle beam focused to the first position;
changing the focus position from the first position to a second position which has a shorter focus length than the first position and/or a third position which has a longer focus length than the first position;
forming a second line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on scanning the charged particle beam focused to the second position and/or the third position;
calculating, for each of the first and second line profiles, a first width on one side of the peak of the line profile; and
determining that the convex part is located on the one side of edge part when the first width of the peak formed at the second position is narrower than the first width of the peak formed at the first position, and/or when the first width of the peak formed at the third position is wider than the first width of the peak formed at the first position.
13. The method according to claim 12 , wherein the determining that the convex part is located on the one side of edge part when a second width of the other side of the peak formed at the second position is wider than the second width of the peak formed at the first position, and/or when the second width of the peak formed at the third position is narrower than the first width of the peak formed at the first position.
14. A method for determining a convex or a concave part of a sample by detecting charged particles emitted from the sample by scanning a charged particle beam, comprising :
changing a focus position of the charged particle beam to a first position by performing an auto focus;
forming a first line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on the charged particle beam focused to the first position;
changing the focus position from the first position to a second position which has a shorter focus length than the first position and/or a third position which has a longer focus length than the first position;
forming a second line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on scanning the charged particle beam focused to the second position and/or the third position;
calculating, for each of the first and second line profiles, a first width on one side of the peak of the line profile; and
determining that the concave part is located on the one side of edge part when the first width of the peak formed at the second position is wider than the first width of the peak formed at the first position, and/or when the first width of the peak formed at the third position is narrower than the first width of the peak formed at the first position.
15. The method according to claim 14 , wherein the determining that the convex part is located on the one side of edge part when a second width of the other side of the peak formed at the second position is narrower than the second width of the peak formed at the first position, and/or when the second width of the peak formed at the third position is wider than the first width of the peak formed at the first position.
16. A charged particle beam apparatus, comprising:
a charged particle source,
a scanning deflector for scanning a charged particle beam emitted from the charged particle source on a sample,
a lens for changing a focus position of the charged particle beam emitted from the charged particle source between a first position determined by performing an auto focus, a second position which has a shorter focus length than the first position, and a third position which has a longer focus length than the first position,
a detector for detecting charged particles emitted from the sample, and
a computing section for processing a signal based on the detected charged particles, wherein the computing section:
forms a first line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on the charged particle beam focused to the first position;
forms a second line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on scanning the charged particle beam focused to the second position and/or the third position;
calculates, for each of the first and second line profiles, a first width on one side of the peak of the line profile; and
determines that the convex part is located on the one side of edge part when the first width of the peak formed at the second position is narrower than the first width of the peak formed at the first position, and/or when the first width of the peak formed at the third position is wider than the first width of the peak formed at the first position.
17. The apparatus according to claim 16 , wherein the determining that the convex part is located on the one side of edge part when a second width of the other side of the peak formed at the second position is wider than the second width of the peak formed at the first position, and/or when the second width of the peak formed at the third position is narrower than the first width of the peak formed at the first position.
18. A charged particle beam apparatus, comprising:
a charged particle source,
a scanning deflector for scanning a charged particle beam emitted from the charged particle source on a sample,
a lens for changing a focus position of the charged particle beam emitted from the charged particle source between a first position determined by performing an auto focus, a second position which has a shorter focus length than the first position, and a third position which has a longer focus length than the first position,
a lens for changing a focus position of the charged particle beam emitted from the charged particle source,
a detector for detecting charged particles emitted from the sample, and
a computing section for processing a signal based on the detected charged particles, wherein the computing section:
forms a first line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on the charged particle beam focused to the first position;
forms a second line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on scanning the charged particle beam focused to the second position and/or the third position;
calculates, for each of the first and second line profiles, a first width on one side of the peak of the line profile; and
determines that the concave part is located on the one side of edge part when the first width of the peak formed at the second position is wider than the first width of the peak formed at the first position, and/or when the first width of the peak formed at the third position is narrower than the first width of the peak formed at the first position.
19. The method according to claim 18 , wherein the determining that the convex part is located on the one side of edge part when a second width of the other side of the peak formed at the second position is narrower than the second width of the peak formed at the first position, and/or when the second width of the peak formed at the third position is wider than the first width of the peak formed at the first position.
20. A non-transitory computer readable medium having executable instructions stored thereon for determining a convex or a concave part of a sample by detecting charged particles emitted from the sample by scanning of a charged particle beam, which when executed by a computer cause the computer to perform a method comprising steps of:
changing a focus position of the charged particle beam to a first position by performing an auto focus;
forming a first line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on the charged particle beam focused to the first position;
changing the focus position from the first position to a second position which has a shorter focus length than the first position and/or a third position which has a longer focus length than the first position;
forming a second line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on scanning the charged particle beam focused to the second position and/or the third position;
calculating, for each of the first and second line profiles, a first width on one side of the peak of the line profile; and
determining that the convex part is located on the one side of edge part when the first width of the peak formed at the second position is narrower than the first width of the peak formed at the first position, and/or when the first width of the peak formed at the third position is wider than the first width of the peak formed at the first position.
21. The non-transitory computer readable medium according to claim 20 , wherein the determining that the convex part is located on the one side of edge part when a second width of the other side of the peak formed at the second position is wider than the second width of the peak formed at the first position, and/or when the second width of the peak formed at the third position is narrower than the first width of the peak formed at the first position.
22. A non-transitory computer readable medium having executable instructions stored thereon for determining a convex or a concave part of a sample by detecting charged particles emitted from the sample by scanning a charged particle beam, which when executed by a computer cause the computer to perform a method comprising steps of:
changing a focus position of the charged particle beam to a first position by performing an auto focus;
forming a first line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on the charged particle beam focused to the first position;
changing the focus position from the first position to a second position which has a shorter focus length than the first position and/or a third position which has a longer focus length than the first position;
forming a second line profile which indicates an edge part located between a convex or concave part of the sample and the adjacent surface based on scanning the charged particle beam focused to the second position and/or the third position;
calculating, for each of the first and second line profiles, a first width on one side of the peak of the line profile; and
determining that the concave part is located on the one side of edge part when the first width of the peak formed at the second position is wider than the first width of the peak formed at the first position, and/or when the first width of the peak formed at the third position is narrower than the first width of the peak formed at the first position.
23. The non-transitory computer readable medium according to claim 22 , wherein the determining that the convex part is located on the one side of edge part when a second width of the other side of the peak formed at the second position is narrower than the second width of the peak formed at the first position, and/or when the second width of the peak formed at the third position is wider than the first width of the peak formed at the first position.