IP Library Granted Patent US 10,684,302
Granted Patent B2
US 10,684,302 · App. 15/758,355 · Granted Jun 16, 2020

Specimen inspection automation system

Inventors: Shigeki Yamaguchi (Tokyo, JP); Shigeru Yano (Tokyo, JP); Toshiki Yamagata (Tokyo, JP); Hiroki Ihara (Tokyo, JP)
Assignee: HITACHI HIGH-TECH CORPORATION
G01N35/04G01N35/00584G01N35/02G01N35/0092G01N35/00603G01N2035/0462G01N2035/0465
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Quick Facts
Patent No.
US 10,684,302
App. No.
15/758,355
Granted
Jun 16, 2020
Kind
B2
Abstract

This specimen inspection automation system is provided with: a processing unit which processes a specimen; a conveying line which conveys carriers; a control device which controls the conveying of the carriers; and external connection modules which deliver the carriers to and from external devices. The control device controls the number of carriers in the specimen inspection automation system within a fixed range on the basis of the number of carriers conveyed into and out of the system by the external connection modules.

Claims (22)

1. A specimen inspection automation system, comprising:

a processing unit which processes a specimen;

a conveying line which conveys carriers, and includes a specimen conveying line for conveying specimen carriers and an empty carrier conveying line for conveying empty carriers;

a control device which controls the conveying of the carriers;

an external connecting module which delivers the carriers to and from an external device,

a carrier buffer module which collects and stores the empty carriers from the empty carrier conveying line and supplies the empty carriers to the empty carrier conveying line, based on information from the control device,

wherein the carrier buffer module keeps the number of empty carriers in the specimen inspection automation system within a certain range based on the number of times of convey-in and convey-out of carriers in the external connecting module.

2. The specimen inspection automation system according to claim 1 ,

wherein the control device restricts convey-in or convey-out of the carrier in the external connecting module by comparing the number of times of convey-in and convey-out with a threshold value.

3. The specimen inspection automation system according to claim 2 ,

wherein the control device starts convey-in or convey-out of the carriers based on priority after restricting the convey-in or convey-out of the carriers.

4. The specimen inspection automation system according to claim 2 , comprising:

a plurality of the external devices,

wherein, in the control device, a threshold value for each of the external devices and a threshold value of the entire system are set, and an absolute value of the threshold value of the entire system is smaller than an absolute value of the sum of the threshold values for each of the external devices.

5. The specimen inspection automation system according to claim 1 ,

wherein the carrier buffer module supplies the empty carriers to the conveying line or collects the empty carriers from the conveying line by comparing the number of times of convey-in and convey-out with a threshold value.

6. The specimen inspection automation system according to claim 1 ,

wherein the carrier buffer module supplies the empty carriers to the conveying line in accordance with information on a request for re-inspection of the specimen.

7. The specimen inspection automation system according to claim 1 ,

wherein the carrier buffer module supplies the empty carriers to the conveying line or collects the empty carriers from the conveying line in accordance with the number of specimens input in the processing unit.

8. The specimen inspection automation system according to claim 1 ,

wherein the number of times of convey-in and convey-out is the number of increase and decrease of the carriers between the external connecting module and the external device based on a certain point of time.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 8, 2018
From: YAMAGUCHI, SHIGEKI; YANO, SHIGERU; YAMAGATA, TOSHIKI; IHARA, HIROKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 045527/0994 →
Cited By (1)
US 12,292,454