IP Library Granted Patent US 10,153,128
Granted Patent B2
US 10,153,128 · App. 15/574,773 · Granted Dec 11, 2018

Charged particle beam apparatus and sample elevating apparatus

Inventors: Masakazu Sugaya (Tokyo, JP); Yusuke Moriwaki (Tokyo, JP); Koichi Terada (Tokyo, JP); Nobuo Shibata (Tokyo, JP); Hironori Ogawa (Tokyo, JP); Hiroyuki Kitsunai (Tokyo, JP); Toshihiko Shimizu (Tokyo, JP); Shuichi Nakagawa (Tokyo, JP)
Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
H01J37/20H01J37/29H01J2237/20285
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,153,128
App. No.
15/574,773
Granted
Dec 11, 2018
Kind
B2
Abstract

To realize a sample lifting and lowering device capable of easily responding to increase of a diameter of a sample with light weight and high rigidity as well as with less directional dependence of rigidity as the sample lifting lowering device arranged above a horizontal movement mechanism. The sample lifting and lowering device includes first and second lifting and lowering mechanisms that lift and lower a sample stage to which the sample is fixed, first and second driving devices that drive the first and second lifting and lowering mechanisms to be lifted and lowered individually and a controller that synchronizes lifting/lowering operations of the first and second lifting and lowering mechanisms by the first and second driving devices by first and second control signals, in which the first lifting and lowering mechanism includes a first deceleration mechanism generating a first drive output obtained by decelerating a first drive input given from the first driving device in a direction different from a direction of the input, the second lifting and lowering mechanism includes a second deceleration mechanism generating a second drive output obtained by decelerating a second drive input given from the second driving device in a direction different from a direction of the input, and directions of the first and second drive inputs are different from each other as well as are not on the same straight line.

Claims (55)

1. A charged particle beam apparatus comprising:

a charged particle source generating a charged particle beam to be irradiated to a sample;

a detection device detecting a signal generated from the sample by irradiation of the charged particle beam;

a horizontal movement mechanism moving the sample to an observation position;

a sample lifting and lowering device arranged above the horizontal movement mechanism; and

a chamber including the charged particle source, the detection device, the horizontal movement mechanism and the sample lifting and lowering device and maintaining an internal space in a reduced pressure environment,

wherein the sample lifting and lowering device includes

first and second lifting and lowering mechanisms that lift and lower a sample stage to which the sample is fixed,

first and second driving devices that drive the first and second lifting and lowering mechanisms to be lifted and lowered individually, and

a controller that synchronizes lifting or lowering operations of the first and second lifting and lowering mechanisms by the first and second driving devices by first and second control signals, and

the first lifting and lowering mechanism includes a first deceleration mechanism generating a first drive output obtained by decelerating a first drive input given from the first driving device in a direction different from a direction of the input,

the second lifting and lowering mechanism includes a second deceleration mechanism generating a second drive output obtained by decelerating a second drive input given from the second driving device in a direction different from a direction of the input, and

directions of the first and second drive inputs are different from each other as well as are not on the same straight line.

2. The charged particle beam apparatus according to claim 1 ,

wherein the sample lifting and lowering device further includes a guide mechanism regulating a movement direction of the sample stage by lifting/lowering driving by the first and second lifting and lowering mechanisms in a vertical direction.

3. The charged particle beam apparatus according to claim 1 ,

wherein the first and second deceleration mechanisms are deceleration mechanisms using a wedge type.

4. The charged particle beam apparatus according to claim 1 ,

wherein the sample lifting and lowering device further includes a third lifting and lowering mechanism that lifts and lowers the sample stage together with the first and second lifting and lowering mechanisms,

a third driving device that drives the third lifting and lowering mechanism to be lifted and lowered individually, and

a controller that synchronizes a lifting or lowering operation of the third lifting and lowering mechanism by the third driving device by a third control signal, and

the third lifting and lowering mechanism includes a third deceleration mechanism generating a third drive output obtained by decelerating a third drive input given from the third driving device in a direction different from a direction of the input, and

directions of the first to third drive inputs are different from one another as well as are not on the same straight line.

5. The charged particle beam apparatus according to claim 4 ,

wherein, when a virtual circle passing positions where the first to third lifting and lowering mechanisms are arranged is determined, any of places where directions of the first to third drive inputs cross is positioned outside the virtual circle.

6. The charged particle beam apparatus according to claim 2 ,

wherein, when a virtual circle passing positions where the first and second lifting and lowering mechanisms and the guide mechanism are arranged is determined, a place where directions of the first and second drive inputs cross is positioned outside the virtual circle.

7. The charged particle beam apparatus according to claim 1 ,

wherein the sample lifting and lowering device further includes a third lifting and lowering mechanism that lifts and lowers the sample stage together with the first and second lifting and lowering mechanisms, and

a barycenter position of the sample stage is positioned inside a triangle having apexes corresponding to arrangement positions or the first, second and third lifting and lowering mechanisms.

8. The charged particle beam apparatus according to claim 2 ,

wherein a barycenter position of the sample stage is positioned inside a triangle having apexes corresponding to arrangement positions of the first and second lifting and lowering mechanisms and the guide mechanism.

9. The charged particle beam apparatus according to claim 1 ,

wherein a barycenter of the sample stage is positioned on a straight line passing arrangement positions of the first and second lifting and lowering mechanisms.

10. The charged particle beam apparatus according to claim 1 ,

wherein the first lifting and lowering mechanism further includes a first measurement device that measures a movement amount in a direction of the first drive input or a movement amount in a direction of the first drive output,

the second lifting and lowering mechanism further includes a second measurement device that measures a movement amount in a direction of the second drive input or a movement amount in a direction of the second drive output, and

the controller compares a measurement result of the first measurement device with a measurement result of the second measurement device to control lifting or lowering operations of the first and second lifting and lowering mechanisms.

11. The charged particle beam apparatus according to claim 1 ,

wherein any one of the first and second lifting and lowering mechanisms further includes a measurement device that measures a movement amount in a direction of the first or second drive input or a movement amount in a direction of the first or second drive output, and

the controller controls a lifting or lowering operation of the other lifting and lowering mechanism in which the measurement device is not provided by using a measurement result of the measurement device as a reference.

12. A sample lifting and lowering device arranged above a horizontal movement mechanism, comprising:

first and second lifting and lowering mechanisms that lift and lower a sample stage to which the sample is fixed;

first and second driving devices that drive the first and second lifting and lowering mechanisms to be lifted and lowered individually; and

a controller that synchronizes lifting or lowering operations of the first and second lifting and lowering mechanisms by the first and second driving devices by first and second control signals,

wherein the first lifting and lowering mechanism includes a first deceleration mechanism generating a first drive output obtained by decelerating a first drive input given from the first driving device in a direction different from a direction of the input,

the second lifting and lowering mechanism includes a second deceleration mechanism generating a second drive output obtained by decelerating a second drive input given from the second driving device in a direction different from a direction of the input, and

directions of the first and second drive inputs are different from each other as well as are not on the same straight line.

13. The sample lifting and lowering device according to claim 12 , further comprising:

a guide mechanism regulating a movement direction of the sample stage by lifting or lowering driving by the first and second lifting and lowering mechanisms in a vertical direction.

14. The sample lifting and lowering device according to claim 12 , further comprising:

a third lifting and lowering mechanism that lifts and lowers the sample stage together with the first and second lifting and lowering mechanisms.

15. The sample lifting and lowering device according to claim 12 ,

wherein any one or both of the first and second lifting and lowering mechanisms further includes a measurement device that measures a movement amount in a direction of a drive input or a movement amount in a direction of a drive output, and

the controller controls lifting or lowering operations of the first and second lifting and lowering mechanisms based on a measurement result by the measurement device.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 24, 2018
From: SUGAYA, MASAKAZU; MORIWAKI, YUSUKE; TERADA, KOICHI; SHIBATA, NOBUO; OGAWA, HIRONORI; SHIMIZU, TOSHIHIKO; NAKAGAWA, SHUICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 047292/0122 →
Priority Claims (1)
JP 2015-100942 · May 18, 2015 · national
Continuity (1)
Related Publication 20180138009A1 · May 17, 2018