Control system and method of semiconductor inspection system
View Patent ↗A control system and method of a semiconductor inspection system are disclosed, wherein the inspection can be conducted without reducing the reliability of measurement even in the case where the supply voltage drops. The control system has a controller, a power supply for a power on-off circuit constituting a switching regulator designed to maintain the output voltage against a supply voltage drop, and a supply voltage drop detector. In the case where a supply voltage drop is detected during the measurement, the measurement is automatically suspended, and after restoring the supply voltage, the measurement is automatically restarted.
1. A control system of a semiconductor inspection system, comprising:
a measurement circuit for electrically processing the measurement data of an object to be inspected;
a controller for controlling the measurement operation of the measurement circuit;
a power on-off circuit for turning on and off the drive power supplied to the measurement circuit and the controller;
a DC power supply for supplying the DC drive power of a constant voltage to the measurement circuit;
a first switching regulator for supplying the DC drive power to the controller; and
a second switching regulator for supplying the DC drive power to the power on-off circuit.
2. A control system of a semiconductor inspection system according to claim 1 ,
comprising a supply voltage monitoring circuit for transmitting to the controller a signal indicating the drop of the supply voltage applied to the DC power supply,
wherein the controller suspends the measurement operation of the measurement circuit based on the voltage drop signal and restarts the measurement operation based on a restoration signal indicating the restoration of the supply voltage to a predetermined value.
3. A control system of a semiconductor inspection system according to claim 2 ,
wherein the supply voltage monitoring circuit includes a transformer, a rectification and smoothing circuit and a hysteresis comparator.
4. A control system of a semiconductor inspection system according to claim 2 ,
wherein a series regulator is used as the DC power supply.