IP Library Granted Patent US 9,575,082
Granted Patent B2
US 9,575,082 · App. 14/786,234 · Granted Feb 21, 2017

Automatic analysis device and automatic analysis method

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Quick Facts
Patent No.
US 9,575,082
App. No.
14/786,234
Granted
Feb 21, 2017
Kind
B2
Abstract

The automatic analysis device includes an analysis unit that corrects, based on a measured value at the time of a first light amount measurement with water dispensed in the reaction cell before the sample is dispensed therein; a measured value at the time of a second light amount measurement after the sample and a preprocessing reagent are dispensed into the reaction cell; a liquid amount in the reaction cell at the time of the second light amount measurement; and a liquid amount in the reaction cell at the time of a third light amount measurement after the reaction reagent has been dispensed into the reaction cell and before the reaction reagent and the substance to be measured react with each other.

Claims (47)

1. An automatic analysis device comprising:

a scattered light measuring unit that measures an amount of scattered light obtained from light irradiation of a reaction cell;

a transmitted light measuring unit that measures an amount of transmitted light obtained from the light irradiation of reaction cell;

a data storage unit that stores data of the measured amounts of scattered light and transmitted light; and

an analysis unit that programmed to compute, based on the measured amounts of scattered light and transmitted light, a concentration of a substance to be measured included in a sample in the reaction cell with respect to an examination item,

wherein the scattered light measuring unit and the transmitted light measuring unit perform:

a first light amount measurement of the scattered light and the transmitted light with water dispensed in the reaction cell before the sample is dispensed therein,

a second light amount measurement of the scattered light and the transmitted light after the sample and a preprocessing reagent are dispensed into the reaction cell,

a third light amount measurement of the scattered light and the transmitted light after a reaction reagent is dispensed into the reaction cell and before the reaction reagent and the substance to be measured react with each other, and

a fourth light amount measurement of the scattered light and the transmitted light after the reaction reagent and the substance to be measured have reacted,

and

wherein the analysis unit is further programmed to correct, based on the measured amounts at the first and the second light amount measurements and a liquid amounts in the reaction cell at each of the second and the third light amount measurements, the measured amount of scattered light at the third light amount measurement and the measured amount of scattered light at fourth light amount measurement, and is further programmed to compute the concentration based on the corrected amounts of the scattered light at the third and the fourth light amount measurements.

2. The automatic analysis device according to claim 1 , wherein the analysis unit is further programmed to compute the concentration based on Slatex3 which is the corrected amount of the scattered light at the third light amount measurement and Slatex4 which is the corrected amount of the scattered light at the fourth light amount measurements according to the expressions:

Slate x 3= Is 3/(( It 2/ It 1)^( V 2/ V 3)), and

Slate x 4= Is 4/(( It 2/ It 1)^( V 2/ V 3)),

where

It1 is the measured amount of transmitted light at the first light amount measurement,

It2 is the measured amount of transmitted light at the second light amount measurement,

V2 is the liquid amount at the second light amount measurement,

V3 is the liquid amount at the third light amount measurement,

Is3 is the measured amount of scattered light at the third light amount measurement, and

Is4 is the measured amount of scattered light at the fourth light amount measurement.

3. The automatic analysis device according to claim 1 , wherein the analysis unit is further programmed to compute the concentration based on Slatex3 which is the corrected amount of the scattered light at the third light amount measurement and Slatex4 which is the corrected amount of the scattered light at the fourth light amount measurements according to the expressions:

Slate x 3= Is 3/(( It 1/ It 0)×( It 2/ It 1)^( V 2/ V 3)), and

Slate x 4= Is 4/(( It 1/ It 0)×( It 2/ It 1)^( V 2/ V 3)),

where

It0 is the measured amount of transmitted light at the first light amount measurement under a condition such that a disturbance factor can be disregarded with water dispensed into the reaction cell,

It1 is the measured amount of transmitted light at the first light amount measurement,

It2 is the measured amount of transmitted light at the second light amount measurement,

V2 is the liquid amount at the second light amount measurement,

V3 is the liquid amount at the third light amount measurement,

Is3 is the measured amount of scattered light at the third light amount measurement, and

Is4 is the measured amount of scattered light at the fourth light amount measurement.

4. The automatic analysis device according to claim 1 , wherein the analysis unit is further programmed to compute the concentration based on Slatex3 which is the corrected amount of the scattered light at the third light amount measurement and Slatex4 which is the corrected amount of the scattered light at the fourth light amount measurements according to the expressions:

Slate x 3=( Is 3− Is 2×( V 2/ V 3)× It 3/ It 2)/(( It 2/ It 1)^( V 2/ V 3)), and

Slate x 4=( Is 4− Is 2×( V 2/ V 3)× It 4/ It 2)/(( It 2/ It 1)^( V 2/ V 3)),

where

It1 is the measured amount of transmitted light at the first light amount measurement,

It2 is the measured amount of transmitted light at the second light amount measurement,

It3 is the measured amount of transmitted light at the third light amount measurement,

V2 is the liquid amount at the second light amount measurement,

V3 is the liquid amount at the third light amount measurement,

Is2 is the measured amount of scattered light at the second light amount measurement,

Is3 is the measured amount of scattered light at the third light amount measurement, and

Is4 is the measured amount of scattered light at the fourth light amount measurement.

5. The automatic analysis device according to claim 1 , wherein the analysis unit is further programmed to display a user interface screen having a check box for inputting an instruction to correct an influence of the sample and/or an influence of the reaction cell.

6. The automatic analysis device according to claim 1 , wherein the analysis unit is further programmed to display, in a measurement result display screen, that an influence corrected for by the computation of the concentration is an influence of the sample and/or an influence of the reaction cell.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2015
From: ADACHI, SAKUICHIRO; YAMAZAKI, HAJIME; IIJIMA, MASAHIKO; MATSUBARA, SHIGEKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 036855/0068 →