Observation method and observation device
View Patent ↗With respect to a charged particle beam device, the step size of focal point measure for executing autofocusing is optimized to a value that is optimal with respect to the spread of an approximation curve for a focal point measure distribution. The step size of focal point measure for executing autofocusing is corrected using an image feature obtained based on a layout image derived from an image obtained at a first magnification or from design data. Autofocusing is executed based on the obtained step size to carry out observation, measurement, or to image the sample under inspection.
1. A charged particle beam device having autofocusing means that obtains a plurality of images with varying focal positions by shifting a focal position in increments of a predetermined step size and estimates a focusing position based on the plurality of images, the charged particle beam device comprising:
imaging means that obtains images at a first magnification and a second magnification greater than the first magnification;
focusing position analysis processing means that obtains an image feature based on a region selected from the image of the first magnification;
step size determination means that obtains a step size based on the image feature obtained by the focusing position analysis processing means; and
autofocus execution means that executes autofocusing at the second magnification using the step size obtained by the step size determination means.
2. The charged particle beam device according to claim 1 , wherein the image feature comprises a sparseness/density or pattern edge amount of a pattern with respect to the selected region.
3. The charged particle beam device according to claim 1 , further comprising step size judging means that judges whether or not the step size that has been set or the image feature satisfies a pre-defined standard.
4. The charged particle beam device according to claim 3 , wherein the step size judging means displays a judgment result.
5. The charged particle beam device according to claim 1 , wherein
the focusing position analysis processing means executes a plurality of methods of calculating the image feature, and
the step size determination means sets the step size used by the autofocus execution means by combining a plurality of step sizes obtained based on the respective image features calculated using the plurality of methods.
6. The charged particle beam device according to claim 5 , wherein the respective image features obtained by the plurality of methods are configurable with respect to their contributions to the step size used by the autofocus execution means.
7. The charged particle beam device according to claim 1 , further comprising an autofocus parameter setting screen, wherein
a mode in which the step size is automatically set using the image feature is selectable.
8. The charged particle beam device according to claim 1 , wherein the image of the first magnification comprises a pattern layout image of CAD data corresponding to an image obtained at the first magnification.
9. The charged particle beam device according to claim 8 , wherein
the focusing position analysis processing means:
divides the pattern layout image into a plurality of regions;
calculates the image feature for each of the divided plurality of regions; and
selects from the plurality of regions a region having an image feature satisfying a pre-defined standard, and
the step size determination means calculates the step size based on an image feature calculated based on the selected region.
10. The charged particle beam device according to claim 9 , wherein the focusing position analysis processing means divides the CAD data into a plurality of regions comprising overlapping parts among adjacent regions.
11. An information processing device connected with a charged particle beam device having autofocusing means that obtains a plurality of images with varying focal positions by shifting a focal position in increments of a predetermined step size and estimates a focusing position based on the plurality of images, the information processing device comprising:
focusing position analysis processing means that obtains an image feature of a region selected from CAD data corresponding to a low-magnification image obtained from the charged particle beam device;
step size determination means that obtains a step size based on the image feature obtained by the focusing position analysis processing means; and
step size sending means that sends the step size obtained by the step size determination means to the charged particle beam device.
12. An observation method using a charged particle beam, the observation method comprising:
obtaining an image at a first magnification;
obtaining an image feature based on a region selected from the image of the first magnification;
obtaining a step size based on the image feature, the step size being an amount of change in focal position for when obtaining a plurality of images with varying focal positions; and
executing autofocusing by obtaining, at a second magnification greater than the first magnification, a plurality of images by shifting a focal position in increments of the step size.
13. The observation method using a charged particle beam according to claim 12 , wherein the image feature comprises a sparseness/density or pattern edge amount of a pattern with respect to the region selected from the image obtained at the first magnification.
14. The observation method using a charged particle beam according to claim 12 , further comprising judging whether or not the step size that has been set or the image feature satisfies a pre-defined standard.
15. The observation method using a charged particle beam according to claim 14 , further comprising displaying a judgment result.
16. The observation method using a charged particle beam according to claim 14 , further comprising calculating the image feature using a plurality of methods, wherein
the step size used for autofocusing is configurable by combining a plurality of step sizes obtained based on the respective image features calculated using the plurality of methods.
17. The observation method using a charged particle beam according to claim 14 , wherein the image of the first magnification comprises a pattern layout image of CAD data corresponding to an image obtained at the first magnification.
18. An autofocusing method in which a plurality of images with varying focal positions are obtained by shifting a focal position in increments of a predetermined step size and in which a focusing position is estimated based on the plurality of images, the autofocusing method comprising:
obtaining an image at a first magnification;
obtaining an image feature based on the image obtained at the first magnification;
based on the image feature, obtaining a pre-defined step size for obtaining a plurality of images with varying focal positions; and
executing autofocusing by obtaining, at a second magnification greater than the first magnification, a plurality of images by shifting a focal position using the step size.