Composite charged particle beam detector, charged particle beam device, and charged particle beam detector
A composite charged particle beam apparatus modulates an irradiation condition of a charged particle beam at high speed and detects a signal in synchronization with a modulation period to extract a signal arising from a particular charged particle beam when a sample is irradiated with a plurality of charged particle beams simultaneously. Light emitted from two or more kinds of scintillators having different light emitting properties is dispersed, signal strength is detected, and a signal is processed based on a ratio of first signal strength when the sample is irradiated with a first charged particle beam alone to second signal strength when the sample is irradiated with a second charged particle beam alone. The apparatus can extract only a signal arising from a desired charged particle beam even when the sample is irradiated with the plurality of charged particle beams simultaneously.
1. A composite charged particle beam apparatus comprising:
a first charged particle beam column which irradiates a sample with a first charged particle beam;
a second charged particle beam column which irradiates the sample with a second charged particle beam;
a charged particle detector which detects a charged particle emitted from the sample;
an image display mechanism which outputs an image on the basis of a signal from the charged particle detector;
a mechanism which sets a ratio of a first signal strength when the sample is irradiated with the first charged particle beam alone to a second signal strength when the sample is irradiated with the second charged particle beam alone;
a computing unit which processes the signal from the detector on the basis of the ratio of the first signal strength to the second signal strength,
wherein the charged particle detector includes:
a charged particle light receiving surface which has two or more kinds of scintillators with different light emitting properties;
a mechanism which applies voltage to the charged particle light receiving surface;
a spectroscopic mechanism which disperses light emitted from the scintillators; and
a detection mechanism which detects each signal strength after dispersion.
2. The composite charged particle beam apparatus according to claim 1 , wherein a composite scintillator formed by mixing two or more kinds of fluorescent particles with different light emitting properties is used for the charged particle light receiving surface.
3. The composite charged particle beam apparatus according to claim 1 , wherein the computing unit is used to calculate signal strength arising from the first charged particle beam when the sample is irradiated with the first charged particle beam and the second charged particle beam simultaneously, and display an image.
4. The composite charged particle beam apparatus according to claim 1 , wherein a ratio of each signal strength is acquired from the each signal strength after dispersion.
5. The composite charged particle beam apparatus according to claim 4 , wherein the ratio of the signal strength is acquired on a GUI screen.
6. The composite charged particle beam apparatus according to claim 4 , further comprising a function which automatically sets the voltage applied to the light receiving surface on the basis of an amount of change in the ratio of the signal strength.
7. The composite charged particle beam apparatus according to claim 6 , further comprising a button on a control panel or a GUI screen, the button being used to execute a function which automatically sets the voltage applied to the light receiving surface.
8. The composite charged particle beam apparatus according to claim 6 , wherein a function of automatically setting the voltage applied to the light receiving surface is executed upon performing a predetermined mouse operation on a specific region of a GUI screen.
9. The composite charged particle beam apparatus according to claim 4 , wherein the ratio of the signal strength acquired is displayed on a GUI screen.