Granted Patent
S1
US 633,538 · App. 29/356,748 · Granted Mar 1, 2011
Electron microscope
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Claims (1)
The ornamental design for an electron microscope, as shown and described.
Assignments (1)
CHANGE OF NAME AND ADDRESS
Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →