Electron beam irradiation apparatus
View Patent ↗The present invention has for its object to provide an electron beam irradiation apparatus which can suppress influences the electric fields generated by a plurality of backscattered electron detectors have. To attain the above object, an electron beam irradiation apparatus equipped with a scanning deflector comprises a plurality of backscattered electron detectors, a power source for detectors which applies voltages to the plural backscattered electron detectors, respectively, and a controller device which adjusts application voltages the power source for detectors delivers, on the basis of an image shift when the voltages are applied to the plural backscattered electron detectors.
1. An electron beam irradiation apparatus equipped with a scan deflector adapted to scan an electron beam emitted from an electron source, comprising:
a detector arranged to detect electrons obtained by irradiation of the electron beam to a sample;
a detector power source which applies voltages to the detector; and
an operation apparatus which calculates an image shift before and after voltage application by the detector power source.
2. The electron beam irradiation apparatus according to claim 1 , comprising:
a plurality of the detectors.
3. The electron beam irradiation apparatus according to claim 2 , comprising:
a controller device which controls the applied voltage of the detector power source so as to suppress the image shift when voltage is applied by the detector power source.
4. The electron beam irradiation apparatus according to claim 2 , wherein:
the controller device calculates the image shift when voltage is applied to all the plurality of the detectors.
5. The electron beam irradiation apparatus according to claim 4 , wherein:
the controller device calculates the image shift when same voltage is applied to the plurality of the detectors.
6. The electron beam irradiation apparatus according to claim 2 , comprising:
a controller device which controls the detector power source.
7. The electron beam irradiation apparatus according to claim 6 , wherein:
the detectors are arranged in a plurality of groups axially symmetrically to an optical axis of the electron beam, and wherein the controller device applies different voltage to each of the groups.
8. The electron beam irradiation apparatus according to claim 1 , wherein:
the operation apparatus calculates the image shift using a pattern displayed in a formed image based on the detection of electrons obtained by scanning of the electron beam.
9. An electron beam irradiation apparatus equipped with a scan deflector adapted to scan an electron beam emitted from an electron source, comprising:
a plurality of detectors arranged to detect electrons obtained by irradiation of the electron beam to a sample;
a detector power source which applies voltages to the plurality of detectors; and
a controller device which controls the detector power source, wherein
the controller device controls voltage to be applied to the plurality of the detectors based on amount of misalignment from an optical axis or scan width of the scan deflector.