Scanning electron microscope and scanning transmission electron microscope
View Patent ↗A scanning transmission electron microscope according to the present invention includes an electron lens system having a small spherical aberration coefficient for enabling three-dimensional observation of a 0.1 nm atomic size structure. The scanning transmission electron microscope according to the present invention also includes an aperture capable of changing an illumination angle; an illumination electron lens system capable of changing the probe size of an electron beam probe and the illumination angle; a secondary electron detector ( 9 ); a transmission electron detector ( 13 ); a forward scattered electron beam detector ( 12 ); a focusing unit ( 16 ); an image processor for identifying image contrast; an image processor for computing image sharpness; a processor for three-dimensional reconstruction of an image; and a mixer ( 18 ) for mixing a secondary electron signal and a specimen forward scattered electron signal.
1. A scanning transmission electron microscope comprising:
a spherical aberration corrector for correcting a spherical aberration of an objective lens;
a secondary electron detector;
a condenser lens that determines an electron beam illumination angle; and
a focusing unit,
wherein a plurality of two-dimensional magnified scanning images of a specimen obtained by the secondary electron detector and having an atomic resolution is recorded, and a structure of a specimen uppermost surface and a structure inside the specimen are both simultaneously observed by varying a focal depth by changing an excitation current for the condenser lens.
2. The scanning transmission electron microscope according to claim 1 , wherein the depth of the structure inside the specimen can be measured based on an image sharpness of the two-dimensional magnified scanning images of the specimen.
3. The scanning transmission electron microscope according to claim 1 , wherein the focal depth can be changed based on a combination of excitation currents for the condenser lens without changing a probe size of the electron beam.
4. The scanning transmission electron microscope according to claim 1 , wherein the specimen has a tapered structure.
5. A scanning transmission electron microscope comprising:
a spherical aberration corrector for correcting a spherical aberration of an objective lens;
a secondary electron detector;
an aperture that determines an electron beam illumination angle; and
a focusing unit,
wherein a plurality of two-dimensional magnified scanning images of a specimen obtained by the secondary electron detector and having an atomic resolution is recorded, and a structure of a specimen uppermost surface and a structure inside the specimen are both simultaneously observed by changing a focal depth by varying the size of the aperture.
6. The scanning transmission electron microscope according to claim 5 , wherein the depth of the structure inside the specimen can be measured based on an image sharpness of the two-dimensional magnified scanning images of the specimen.
7. The scanning transmission electron microscope according to claim 5 , wherein the focal depth can be changed by changing the aperture size without changing a probe size of the electron beam.
8. The scanning transmission electron microscope according to claim 5 , wherein the specimen has a tapered structure.
9. A scanning transmission electron microscope comprising:
a spherical aberration corrector for correcting a spherical aberration of an objective lens;
a secondary electron detector;
a condenser lens that determines an electron beam illumination angle; and
a focusing unit,
wherein a plurality of two-dimensional magnified scanning images of a specimen obtained by the secondary electron detector and having an atomic resolution is recorded, a structure of a specimen uppermost surface and a structure inside the specimen can be both simultaneously observed by changing a focal depth by changing an excitation current for the condenser lens, the depth of the structure existing inside the specimen is measured by defocusing an electron beam with which the specimen is irradiated, and an optimum focal depth is determined.
10. The scanning transmission electron microscope according to claim 9 , wherein an image sharpness is determined on a pixel unit basis, the depth of the structure existing inside the specimen is measured, the optimum focal depth is determined, and the depth of the structure inside the specimen is measured.
11. The scanning transmission electron microscope according to claim 10 , wherein the depth of the structure inside the specimen is measured, and a pixel-by-pixel image sharpness evaluation result is acquired in association with a two-dimensional image.
12. The scanning transmission electron microscope according to claim 10 , wherein a pixel-by-pixel image sharpness evaluation result is provided in a two-dimensional image, and a table for setting the pixel-by-pixel optimum focal depth and the electron beam illumination angle, and the condenser lens current is provided.