Manufacturing method in plasma processing apparatus
View Patent ↗A manufacturing method includes steps of: placing a film composed of dielectric, on the top surface of a sample stage, forming a film-like heater on the film made of the dielectric, supplying power to the heater to detect a temperature distribution, adjusting a resistance value of the heater on the basis of a result of detection of a temperature distribution so that the temperature distribution has a predetermined value, and then forming the film composed of the dielectric, on the heater.
1. A manufacturing method of a plasma processing apparatus comprising a sample stage located in a processing chamber in which plasma is generated, the sample stage having a wafer mounting surface on a top surface thereof on which the wafer is mounted, a film made of a dielectric material and located on the wafer mounting surface of the sample stage, and a film-like heater arranged inside the film made of the dielectric material, the plasma processing apparatus executing plasma processing while using the film-like heater to heat the wafer placed on the wafer surface, the method comprising the steps of:
forming a first layer of the film made of the dielectric material on the top surface of the sample stage,
forming the film-like heater on the first layer of the film made of the dielectric material, the film-like heater being constituted by spray coating a metal material on the first layer of the film in a radial and circumferential direction with predetermined widths,
supplying power to the film-like heater to detect a temperature distribution on a plane of the top surface of the sample stage,
adjusting a shape of the film-like heater on the basis of a result of the detection of the temperature distribution to adjust a resistance value of the film-like heater so that the temperature distribution has a predetermined value, and
forming a second layer of the film made of the dielectric material on the film-like heater so that the film-like heater is disposed within the first and second layers of the film made of the dielectric material.
2. The manufacturing method in the plasma processing apparatus according to claim 1 , wherein the temperature distribution is detected using a noncontact surface thermometer.
3. The manufacturing method in the plasma processing apparatus according to claim 1 , wherein the step of adjusting the shape of the film-like heater includes reducing the cross section of the film-like heater corresponding to a low temperature portion of the temperature distribution.
4. The manufacturing method in the plasma processing apparatus according to claim 1 , wherein the step of adjusting the shape of the film-like heater includes increasing the cross section of the film-like heater corresponding to a high temperature portion of the temperature distribution.
5. The manufacturing method in the plasma processing apparatus according to claim 1 , wherein the heater is divided into at least three areas in a circumferential direction of the surface on which the wafer is mounted, a distribution of the resistance value of the heater is detected, and the resistance value of the heater is adjusted for each of the areas.
6. The manufacturing method in the plasma processing apparatus according to claim 2 , wherein the heater is divided into at least three areas in a circumferential direction of the surface on which the wafer is mounted, a distribution of the resistance value of the heater is detected, and the resistance value of the heater is adjusted for each of the areas.
7. The manufacturing method in the plasma processing apparatus according to claim 3 , wherein the heater is divided into at least three areas in a circumferential direction of the surface on which the wafer is mounted, a distribution of the resistance value of the heater is detected, and the resistance value of the heater is adjusted for each of the areas.
8. The manufacturing method in the plasma processing apparatus according to claim 5 , wherein the resistance value is adjusted on the basis of an average temperature distribution of each of the areas.