Pattern measuring method
View Patent ↗A pattern measuring method calculates an average pattern shape from a plurality of the same patterns appearing within an image captured using an electron microscope, and compares pattern information at each measuring position with average pattern information to determine roughness.
1. A method of measuring a shape of repeated patterns using a scanning electron microscope, comprising the steps of:
capturing an image of a specimen at a scaling factor which permits a plurality of patterns under measurement to appear within a field of view;
creating a plurality of profiles in a shape measuring area corresponding to each of the plurality of patterns under measurement;
calculating an average profile by averaging the plurality of profiles created in all the shape measuring areas corresponding to the plurality of patterns under measurement; and
determining a shape roughness for the shape measuring area corresponding to each pattern under measurement using the average profile and the plurality of profiles created in the shape measuring area of each pattern under measurement.
2. A pattern measuring method according to claim 1 , wherein said pattern under measurement is a line or a space pattern, and said step of determining a shape roughness includes calculating the width of a line or a space from the profile, and calculating an average width of the line or the space from the average profile to determine width roughness as the shape roughness.
3. A pattern measuring method according to claim 2 wherein said step of calculating the average profile includes averaging the plurality of profiles created in the shape measuring area corresponding to each of the plurality of patterns under measurement.
4. A pattern measuring method according to claim 2 , wherein said step of calculating the average profile includes accumulating luminance values in the shape measuring area for each of the patterns under measurement in a direction along the line or the space to create a accumulated profile, and averaging the accumulated profiles.
5. A pattern measuring method according to claim 1 wherein said step of calculating the average profile includes averaging the plurality of profiles created in the shape measuring area corresponding to each of the plurality of patterns under measurement.