Plasma processing apparatus and plasma processing method
View Patent ↗A plasma processing method includes forming plasma in a processing chamber; and performing etching to a film to be processed of a film structure that has previously been disposed on an upper surface of a wafer that includes a plurality of film layers. The film structure includes: a lower film including at least one film layer and a groove structure; and an upper film including at least one film layer that covers an inside and an upper end of the groove structure. The plasma processing method includes: removing the upper film by etching until an upper end of the groove structure of the lower film is exposed; performing etching to a film layer of the upper film inside the groove structure; and determining an end point by using a value of thickness of the film layer inside the groove structure of the lower film upon completion of the removing.
1. A plasma processing method comprising:
disposing a wafer to be processed in a processing chamber inside a vacuum chamber;
forming plasma in the processing chamber; and
performing etching to a film to be processed of a film structure that has previously been disposed on the upper surface of the wafer and that includes a plurality of film layers,
wherein the film structure includes:
a lower film including at least one film layer and a groove structure; and
an upper film including at least one film layer that covers an inside and an upper end of the groove structure and that is laminated above,
the plasma processing method comprising:
removing the upper film by etching until an upper end of the groove structure of the lower film is exposed;
performing etching to a film layer of the upper film inside the groove structure; and
determining an end point of the performing, by using a value of thickness of the film layer inside the groove structure of the lower film upon completion of the removing.
2. The plasma processing method according to claim 1 , comprising the determining the end point of the performing by using a value of remaining film thickness of the film layer of the upper film inside the groove structure, the value being detected by using pieces of intensity of a plurality of wavelengths in interference light acquired by the film structure during the performing.
3. The plasma processing method according to claim 1 ,
wherein the film layer of the upper film inside the groove structure includes substantially the same material as the film layer above the upper end of the groove structure.
4. The plasma processing method according to claim 1 , further comprising determining an end point of the removing based on a variation of light emission of the plasma due to the exposure of the upper end of the groove structure of the lower film.
5. The plasma processing method according to claim 1 ,
wherein, in the film structure, reflectivity of the film layer inside the groove structure is higher than reflectivity of the film layer included in the upper end of the groove structure.