Electron microscope and electron beam detector
An electron microscope is provided with a scintillator ( 7 ) and a light guide ( 8 ). The scintillator ( 7 ) has an index of refraction greater than the index of refraction of the light guide ( 8 ), and an end surface ( 72 ) joined to the light guide ( 8 ) is formed from a curved surface with a convex shape on the outside. The scintillator ( 7 ) is formed by a Y—Al—O based ceramic sintered body represented by the compositional formula (Ln 1-x Ce x ) 3 M 5 O 12 (wherein Ln represents at least one element selected from the group consisting of Y, Gd, La, and Lu, and M represents either or both of Al and Ga).
1. An electron microscope comprising:
a plate-like scintillator configured to make luminescence by incidence of an electron; and
a light guide having a refractive index smaller than that of the scintillator and configured to pass the luminescence made by the scintillator, wherein
the scintillator has:
a first end face which is joined to the light guide;
a second end face opposite to the first end face;
a first surface, between the first end face the second end face, on which the electron is incident;
a second surface opposite to the first surface and between the first end face and the second end face; and
a light reflection layer on the second end face and the second surface, and
the second surface is inclined with respect to the first surface, wherein a distance between the second surface and the first surface decreases with increasing distance from the light guide, and
the second end face is so formed to have an are becoming smaller with increasing distance from the light guide.
2. The electron microscope according to claim 1 , wherein the scintillator and the light guide are joined through a material layer having a refractive index smaller than that of the scintillator.
3. The electron microscope according to claim 1 , wherein a surface of the scintillator other than the first and second end face is a flat face or a curved face that is concave to an inner side of the scintillator.
4. The electron microscope according to claim 1 , wherein the second end face comprises two faces extending away from the first light guide, and contacting with each other at the farthest point from the first light guide to form an angle of 180 degrees or less by the two faces.
5. The electron microscope according to claim 1 , wherein
light reflection layers are further formed on the first surface of the scintillator, and
the light reflection layer of the second surface has a thickness greater than that of the light reflection layer of the first surface.
6. The electron microscope according to claim 1 , wherein
the scintillator is divided into a plurality of parts, and
independent light guides are connected to the divided parts of the scintillator, respectively.
7. The electron microscope according to claim 1 , wherein
the scintillator is formed of Y—Al—O based sintered ceramic represented by a chemical formula (Ln 1-x Ce x ) 3 M 5 O 12 (wherein Ln represents at least one element selected from Y, Gd, La and Lu, and M represents at least one element selected from Al and Ga).
8. The electron microscope according to claim 7 , wherein
a Ce composition ratio x in the Y—Al—O based sintered ceramic is 0.002≦x≦0.025.