IP Library Assignment 038085/0008
Patent Assignment
Reel/Frame 038085/0008

Assignment of Assignor's Interest

Recorded: 2016-03-23 Pages: 4
Assignors
IMAMURA, SHIN
Executed: 2015-02-04
OHSHIMA, TAKASHI
Executed: 2015-02-19
OSE, YOICHI
Executed: 2015-02-04
HIRANE, KENICHI
Executed: 2015-02-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 1058717, JAPAN
Covered Property (1)
Electron Microscope and Electron Beam Detector
Patent: 9,355,815 →
Application: 14/423,081 →
Publication: US 2015/0214002
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →