Electron beam apparatus and electron beam inspection method
View Patent ↗An electron beam apparatus which includes a sample stage on which a sample is placed, and an electron optical system. The electron optical system includes an electron gun that generates a primary electron beam, an immersion objective lens that converges the primary electron beam on the sample, an E×B deflector that separates a secondary particle, which is generated from irradiation of the primary beam to the sample, from an optical axis of the primary beam, a reflecting member to which the secondary particle collides, an assist electrode which is located under the reflecting member, a plurality of incidental particle detectors that selectively detect a velocity component and an azimuth component of a ternary particle which is generated by the secondary particle colliding to the reflecting member, and a center detector that is located above the reflecting member.
1. An electron beam apparatus including a sample stage on which a sample is placed, and an electron optical system, the electron optical system comprising:
an electron gun that generates a primary electron beam;
an immersion objective lens that converges the primary electron beam on the sample;
an E×B deflector that separates a secondary particle, which is generated from irradiation of the primary beam to the sample, from an optical axis of the primary beam;
a reflecting member to which the secondary particle collides;
an assist electrode which is located under the reflecting member;
a plurality of incidental particle detectors that selectively detect a velocity component and an azimuth component of a ternary particle which is generated by the secondary particle colliding to the reflecting member; and
a center detector that is located above the reflecting member.
2. The electron beam apparatus according to claim 1 , wherein the E×B deflector is located under the assist electrode.