IP Library Granted Patent US 7,999,222
Granted Patent B2
US 7,999,222 · App. 12/474,992 · Granted Aug 16, 2011

Time-of-flight mass spectrometer

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Quick Facts
Patent No.
US 7,999,222
App. No.
12/474,992
Granted
Aug 16, 2011
Kind
B2
Abstract

A time-of-flight mass spectrometer includes a detector and is adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion. The time-of-flight mass spectrometer scans a voltage applied to an ion incident side surface of the detector in accordance with a mass to be measured. An electrode is provided between the detector and a space in which an ion flies. The time-of-flight mass spectrometer is capable of measuring ions of a wide range of masses with high detection efficiency by scanning a voltage applied to the electrode.

Claims (17)

1. A time-of-flight mass spectrometer comprising a detector and adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion,

wherein a voltage applied to an ion incident side surface of the detector is scanned.

2. The time-of-flight mass spectrometer according to claim 1 ,

wherein the detector has an ion incident side electrode, and

the voltage applied to the ion incident side surface of the detector is a voltage applied to the ion incident side electrode.

3. The time-of-flight mass spectrometer according to claim 2 ,

wherein the voltage applied to the ion incident side electrode is scanned in accordance with a mass to be measured.

4. A time-of-flight mass spectrometer comprising a detector and adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion,

wherein the detector has an ion incident side electrode and a voltage application electrode,

the voltage application electrode is located on an ion incident side of the detector with respect to the ion incident side electrode, and

a voltage applied to the voltage application electrode is scanned.

5. The time-of-flight mass spectrometer according to claim 3 ,

wherein the voltage applied to the voltage application electrode is scanned in accordance with a mass to be measured.

6. The time-of-flight mass spectrometer according to claim 1 ,

wherein the applied voltage is in a range of 200 V to 10 kV.

7. The time-of-flight mass spectrometer according to claim 1 ,

wherein the detector has an ion incident side electrode, an ion outgoing side electrode and an anode electrode, the ion outgoing side electrode and the anode electrode being located on the side opposite to an ion incident side of the ion incident side electrode.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2009
From: SHISHIKA, TSUKASA; TERUI, YASUSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 022996/0602 →