Electrostatic deflection control circuit and method of electronic beam measuring apparatus
View Patent ↗An electrostatic deflection circuit and method of an electronic beam measuring apparatus which can achieve the high precision of the electronic beam measuring and contribute to the simplification of the structure of the apparatus is provided. In an analog arithmetic circuit included in an analog operation part constituting an electrostatic deflection circuit, output voltages of multipliers are added and output by an adder. When the magnification is low, as the side of an ordinarily closed contact is closed driven by a relay driving circuit, the output of the adder is amplified by a high gain amplifier with a high amplification factor and applied to an electrostatic deflecting board. When the magnification is high, the side of an ordinarily open contact is closed and it is amplified by a low gain amplifier with a low amplification factor and applied to the electrostatic deflecting board in the same way.
1. A charged particle beam apparatus, comprising:
a charged particle source;
an electrostatic deflection device which scans a charged particle beam emitted from the charged particle source; and
an electrostatic deflection circuit which controls the electrostatic deflection device, wherein:
the electrostatic deflection circuit includes a first operational amplifier with a first amplification factor and a second operational amplifier with a second amplification factor which is lower than the first amplification factor;
the electrostatic deflection circuit controls the electrostatic deflection device to scan by using the first operational amplifier, if a scanning width of the charged particle beam is equal to or wider than a predetermined width; and
the electrostatic deflection circuit controls the electrostatic deflection device to scan by using the second operational amplifier, if the scanning width of the charged particle beam is less than the predetermined width.
2. The charged particle beam apparatus according to claim 1 ,
wherein the charged particle beam apparatus is a scanning electron microscope or a focused ion beam device.
3. A charged particle beam apparatus, comprising:
a charged particle source;
an electrostatic deflection device which scans a charged particle beam emitted from the charged particle source; and
an electrostatic deflection circuit which controls the electrostatic deflection device, wherein:
the electrostatic deflection device includes a plurality of electrostatic deflecting boards which are arranged in a ring and an electrostatic field is generated in the ring; and
the electrostatic deflecting circuit includes at least two operational amplifying circuits and switches the at least two operational amplifying circuits based on a scanning width of the charged particle beam.
4. The charged particle beam apparatus according to claim 3 , wherein:
the at least two operational amplifying circuits include a first operational amplifier with a first amplification factor and a second operational amplifier with a second amplification factor;
the electrostatic deflection circuit controls the electrostatic deflection device to scan the charged particle beam by using the first operational amplifier if the scanning width of the charged particle beam is equal to or wider than a predetermined width; and
the electrostatic deflection circuit controls the electrostatic deflection device to scan the charged particle beam by using the second operational amplifier if the scanning width of the charged particle beam is less than the predetermined width.
5. The charged particle beam apparatus according to claim 4 ,
wherein the charged particle beam apparatus is a scanning electron microscope or a focused ion beam device.