IP Library Granted Patent US 7,446,313
Granted Patent B2
US 7,446,313 · App. 11/357,020 · Granted Nov 4, 2008

Scanning electron microscope

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Quick Facts
Patent No.
US 7,446,313
App. No.
11/357,020
Granted
Nov 4, 2008
Kind
B2
Abstract

It is facilitated in a scanning electron microscope to save the labor of executing the reproduction test, conduct basic analysis on a problem caused in execution of the automatic observation process, and confirm details resulting in the error. Upon detecting an error from an abnormality, the scanning electron microscope extracts a sample image Im(t 2 ) obtained by retroceding from a sample image Im(te) stored so as to be associated with time te of error occurrence by a predetermined video quantity (for example, total recording time period t 2 ) previously set and registered by an input-output device, from sample images stored in a recording device while being overwritten, and stores a resultant sample image in another recording device.

Claims (17)

1. A scanning electron microscope including

an electro-optical system for scanning and irradiating top of a sample with an electron beam;

a detection system for detecting a signal generated from a sample by the scanning and irradiation with the electron beam conducted by the electro-optical system; and

automatic observation control means for controlling operation of the electro-optical system and executing an automatic observation process of the sample by using the detection system in accordance with a previously registered recipe,

the scanning electron microscope comprising:

image generation means for generating a sample image on the basis of a detected signal supplied from the detection system;

image storage means for successively storing the sample image generated by said image generation means, and recording the sample image corresponding to a predetermined video quantity while successively overwriting the sample image;

error image recording means for recording the sample image transferred from said image storage means; and

recording control means responsive to an error in execution conducted by the automatic observation control means, for retroceding in the sample image successively stored in said image storage means before occurrence of the execution error included in the sample image successively stored in said image storage means, from time of the occurrence of the execution error by a predetermined video quantity, and recording the sample image in said error image recording means.

2. A scanning electron microscope according to claim 1 , wherein when retroceding from the occurrence time of the error, which has occurred during execution conducted by the automatic observation control means, by a predetermined video quantity, and recording the sample image in said error image recording means, said recording control means records the sample image in association with recording of observation conditions of the automatic observation process that is being executed at the time of error occurrence of the execution conducted by the automatic observation control means.

3. A scanning electron microscope according to claim 1 , wherein when retroceding from the occurrence time of the error, which has occurred during execution conducted by the automatic observation control means, by a predetermined video quantity, and recording the sample image in said error image recording means, said recording control means records the sample image in association with recording of error information concerning the execution error that has occurred.

4. A scanning electron microscope according to claim 1 , further comprising perusal control means for reading out the sample image recorded in said error image recording means and supplying a reproduced output of the sample image to display means.

5. A scanning electron microscope according to claim 3 , further comprising perusal control means for reading out a sample image corresponding to specified error information from among sample images recorded in said error image recording means, and supplying a reproduced output of the sample image to display means.

6. A storage medium storing a program to receive image data transmitted from a scanning electron microscope and control a scanning electron microscope control device for storing the image data, the program executing a sequence comprising the steps of:

storing a plurality of images transmitted from the scanning electron microscope;

receiving an error signal transmitted from the scanning electron microscope; and

selectively storing a predetermined number of images stored before receiving the error signal as an error monitor image.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 21, 2006
From: MAEDA, TATSUYA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 017580/0506 →