IP Library Granted Patent US 11,156,628
Granted Patent B2
US 11,156,628 · App. 16/479,957 · Granted Oct 26, 2021

Automatic analyzer

Inventors: Takamichi Mori (Tokyo, JP); Tetsuji Kawahara (Tokyo, JP); Yuichi Iwase (Tokyo, JP)
Assignee: HITACHI HIGH-TECH CORPORATION
G01N35/1002G01N35/1004G01N35/1011
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,156,628
App. No.
16/479,957
Granted
Oct 26, 2021
Kind
B2
Abstract

An automatic analyzer includes a cleaning mechanism performing cleaning to drying of a probe in a short time even with a wide cleaning range of the probe. The automatic analyzer includes: a cleaning tank into which a probe is insertable and which has a cleaning port provided with suction openings; a vacuum tank; a vacuum pump that causes the vacuum tank to enter a negative pressure state, compared to atmospheric pressure; a vacuum bin; a suction nozzle that connects the suction opening of the cleaning port and the vacuum bin; a vacuum nozzle that connects the vacuum tank and the vacuum bin; and a controller. The controller causes the vacuum tank which is in the negative pressure state and the cleaning port to be conducted via the vacuum bin in a period during which a cleaning solution, with which the probe is cleaned, is discharged through the cleaning port.

Claims (38)

1. An automatic analyzer equipped with a cleaning mechanism for performing cleaning to drying of a probe of a dispensing mechanism of the automatic analyzer; the automatic analyzer comprising:

a cleaning tank into which the probe is insertable and; the cleaning tank including a cleaning port provided with a suction opening;

a vacuum tank;

a vacuum pump configured to cause the vacuum tank to enter a negative pressure state, compared to atmospheric pressure;

a vacuum bin;

a suction nozzle that connects the suction opening of the cleaning port and the vacuum bin to each other;

a vacuum nozzle that connects the vacuum tank and the vacuum bin to each other; and

a controller configured to cause the vacuum tank which is in the negative pressure state and the cleaning port to be conducted via the vacuum bin in a period during which a cleaning solution, with which the probe is cleaned, is discharged through the cleaning port,

wherein the vacuum bin is provided with a first space and a second space which are formed in a longitudinal direction of a vacuum bin main body through a first divider having a first air inlet, and

wherein a tip of the vacuum nozzle is disposed in the first space of the vacuum bin, the suction nozzle penetrates through the first divider, and a tip of the suction nozzle is disposed in the second space thereof.

2. The automatic analyzer according to claim 1 ,

wherein an axis that passes through the center of the first air inlet of the first divider and extends in the longitudinal direction of the vacuum bin main body and a central axis of the vacuum nozzle are not coincident with each other.

3. The automatic analyzer according to claim 2 ,

wherein the first divider of the vacuum bin has a tapered shape that tapers from the first space toward the second space and the first air inlet is formed in the most tapered portion thereof.

4. The automatic analyzer according to claim 1 , further comprising:

a first valve that regulates connection of the vacuum tank which is in the negative pressure state and the cleaning port; and

a second valve that regulates a discharge of a cleaning solution stored in the vacuum bin,

wherein the controller is configured to close the first valve and open the second valve after a predetermined time elapses.

5. The automatic analyzer according to claim 4 , further comprising:

a third valve that regulates connection of the vacuum bin and the vacuum tank,

wherein the first valve is provided between the vacuum bin and the suction opening of the cleaning port, and

wherein the controller is configured to close the third valve and close the first valve after a predetermined time elapses.

6. The automatic analyzer according to claim 3 ,

wherein the vacuum bin is provided with a vacuum nozzle cover at the tip of the vacuum nozzle.

7. The automatic analyzer according to claim 3 ,

wherein the suction nozzle has a choke shape inside thereof.

8. The automatic analyzer according to claim 3 ,

wherein the vacuum bin is provided with a second divider that forms a third space in the second space thereof, and

wherein the second divider has a tapered shape that tapers in a direction opposite to the first divider, and a slit-shaped second air inlet is provided in a peripheral portion of the second divider.

9. The automatic analyzer according to claim 8 ,

wherein the third space of the vacuum bin is a space formed by the first divider and the second divider, and

wherein a relationship of an opening area of the second air inlet an opening area of the first air inlet an opening area of the vacuum nozzle is satisfied.

10. The automatic analyzer according to claim 1 ,

wherein at least a part of the vacuum bin main body is made of a transparent resin.

11. The automatic analyzer according to claim 1 ,

wherein the probe is a reagent probe.

12. The automatic analyzer according to claim 11 ,

wherein the controller is configured to cause the vacuum tank which is in the negative pressure state and the cleaning port to be conducted via the vacuum bin in a period during which an internal cleaning solution, with which an internal side of the reagent probe is cleaned, is discharged through the cleaning port.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2019
From: MORI, TAKAMICHI; KAWAHARA, TETSUJI; IWASE, YUICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 049827/0534 →
Priority Claims (1)
JP JP2017-034027 · Feb 24, 2017 · national
Continuity (1)
Related Publication 20190339296A1 · Nov 7, 2019