Charged particle beam device
An object of the present invention is to provide a charged particle beam device capable of correcting an image drift caused by stage deformation or the like during imaging immediately after stage movement. In order to achieve the above object, proposed is a charged particle beam device including: a sample chamber; a sample stage arranged in the sample chamber; a charged particle beam source which releases a charged particle beam; a deflector which deflects the charged particle beam released from the charged particle beam source; a focusing lens which focuses the charged particle beam; and a control device that controls the sample stage and the deflector, in which the control device calculates a deflection signal to be supplied to the deflector based on a thrust information when driving of the sample stage and a coefficient assigned for each position of the sample stage.
1. A charged particle beam device comprising:
a sample chamber;
a sample stage arranged in the sample chamber and configured to hold a sample thereon;
a motor configured to drive the sample stage to move;
a charged particle beam source configured to release a charged particle beam;
a deflector configured to deflect the charged particle beam released from the charged particle beam source;
a focusing lens configured to focus the charged particle beam; and
a detector configured to detect secondary particles generated from irradiating a sample on the sample stage with the charged particle beam;
an image processor configured to generate an image from signals output from the detector; and
a control device configured to control the motor to drive the sample stage based on thrust information and to control the deflector based on a deflection signal,
wherein the control device is further configured to calculate the deflection signal to be supplied to the deflector based on an image drift amount,
wherein the control device is further configured to calculate the image drift amount according to a predetermined correction formula based on the thrust information for driving the sample stage and a coefficient, and
wherein the coefficient is a function of coordinates of an observation point of a sample on the sample stage.
2. The charged particle beam device according to claim 1 , wherein
the control device is further configured to update the correction formula when an image drift amount determined from the image generated by the image processor exceeds an allowable range.
3. A charged particle beam device comprising:
a sample chamber;
a sample stage arranged in the sample chamber and configured to hold a sample thereon;
a motor configured to drive the sample stage to move;
a charged particle beam source configured to release a charged particle beam;
a deflector configured to deflect the charged particle beam released from the charged particle beam source;
a focusing lens configured to focus the charged particle beam;
a detector configured to detect secondary particles generated from irradiating a sample on the sample stage with the charged particle beam;
an image processor configured to generate an image from signals output from the detector; and
a control device configured to control the motor to drive the sample stage based on thrust information and to control the deflector based on a deflection signal,
wherein the control device is further configured calculate a deflection signal to be supplied to the deflector based on an image drift amount,
wherein the control device is further configured to calculate the image drift amount according to a predetermined correction formula based on the thrust information for driving the sample stage and a coefficient, and
wherein the coefficient is selected from a correction map storing predetermined values of the coefficient for each combination of coordinates of observation points of a sample on the sample stage and moving directions of the sample stage.