Shape measuring device and shape measuring method
View Patent ↗This invention is to provide a shape measuring device and a shape measuring method that can accurately measure a cross-sectional shape or a three-dimensional shape of a sample without using matching of characteristics. A shape measuring apparatus comprises a charged particle beam apparatus comprising a processor for measuring detected charged particles signal generated from the sample. The charged particle beam is irradiated to sample at first angle to generate a first signal and second angle to generate second signal. The processor selects a parameter indicating a relation between the first signal and a height of the sample or an inclination angle of the specimen until the first signal which achieves the second signal.
1. A shape measuring apparatus comprises a charged particle beam apparatus comprising: a charged particle gun for emitting a charged particle beam, a scanning deflector for deflecting the charged particle beam on a sample, a detector for detecting charged particles emitted from an area scanned by the charged particle beam on the sample, and an image processor for measuring detected charged particles signal, wherein the image processor performs steps comprising:
irradiating the charged particle beam to the sample at a first angle, and measuring charged particles to generate a first signal,
irradiating the charged particle beam to the sample at a second angle, and measuring charged particles to generate a second signal,
varying a parameter indicating a relation between the first signal and a height of the sample or an inclination angle of the sample until the first signal achieves the second signal, and
measuring the height of the sample or the inclination angle of the sample from detected charged particles based on the selected parameter.
2. The shape measuring apparatus according to claim 1 further comprising an input device for inputting information regarding to height of the sample to the image processor, wherein the image processor calculates the inclination angle using the inputted height information and the selected parameter.
3. The shape measuring apparatus according to claim 1 wherein, the image processor measures a shape of a cross-section based on charged particles emitted from the sample when the charged particle beam is scanned to a perpendicular direction against a direction of line scan.
4. The shape measuring apparatus according to claim 1 wherein, the image processor selects the parameter such that the difference of the first detected charged particles quantity and the second detected charged particles quantity is most near to the difference of detected charged particle quantity depending on the two angles difference.
5. A method for measuring a shape of a sample comprising steps of:
irradiating the charged particle beam to the sample at a first angle, and measuring charged particles to generate a first signal,
irradiating the charged particle beam to the sample at a second angle, and measuring charged particles to generate a second signal,
varying a parameter indicating a relation between the first signal and a height of the sample or an inclination angle of the sample until the first signal achieves the second signal, and
measuring the height of the sample or the inclination angle of the sample from detected charged particles based on the selected parameter.
6. A program product for measuring a shape of a sample by a shape measuring apparatus comprising a charged particle beam apparatus comprising: a charged particle gun for emitting a charged particle beam, a scanning deflector for deflecting the charged particle beam on a sample, a detector for detecting charged particles emitted from an area scanned by the charged particle beam on the sample, the product comprising: executable code embodied in a readable medium, execution code causing the apparatus to perform a sequence of steps comprising:
irradiating the charged particle beam to the sample at a first angle, and measuring charged particles to generate a first signal,
irradiating the charged particle beam to the sample at a second angle, and measuring charged particles to generate a second signal,
varying a parameter indicating a relation between the first signal and a height of the sample or an inclination angle of the sample until the first signal achieves the second signal, and
measuring the height of the sample or the inclination angle of the sample from detected charged particles based on the selected parameter.