Charged particle radiation device
View Patent ↗The present invention provides a scanning charged particle beam device including a sample chamber ( 8 ) and a detector. The detector has: a function of detecting light at least ranging from the vacuum ultraviolet region to the visible light region, of light ( 17 ) having image information which is obtained by a light emission phenomenon of gas scintillation when the sample chamber is controlled to a low vacuum (1 Pa to 3,000 Pa); and a function of detecting ion currents ( 11, 13 ) having image information which are obtained by cascade amplification of electrons and gas molecules. Accordingly, it becomes possible to realize a device which can deal with observation of various samples. Further, an optimal configuration of the detection unit is devised, to thereby make it possible to add value to an obtained image and provide users in wide-ranging fields with the observation image. In addition, the detector is made usable in combination with a detector for high vacuum, to thereby make it possible to provide wide-ranging users with the image, irrespective of the vacuum mode.
1. A charged particle beam device, comprising:
a charged particle source;
a charged particle optical system which focuses a primary charged particle beam emitted from the charged particle source to scan a sample therewith; and
a sample chamber which is capable of keeping its inside with a constant gas pressure,
wherein the charged particle beam device further comprises:
a detector that includes: an electrode to which a positive voltage is applied; and
a light guide which can transmit therethrough light at least ranging from a vacuum ultraviolet light region to a visible light region,
wherein the detector detects, by the light guide, light of gas scintillation generated by the electrode.
2. The charged particle beam device according to claim 1 , wherein a material of the light guide is quartz.
3. The charged particle beam device according to claim 1 , wherein the light of gas scintillation is derived from nitrogen molecules.
4. The charged particle beam device according to claim 1 , wherein a voltage of the electrode and a gas pressure of the sample chamber are controlled by selection of an optimal condition table which is obtained in advance.
5. The charged particle beam device according to claim 1 , wherein shape of the electrode is a mesh-like pattern, a ring-like pattern, a plate-like pattern, or a multi-bar-like pattern.
6. The charged particle beam device according to claim 1 , wherein light from a side surface of the light guide is detected.
7. The charged particle beam device according to claim 1 , wherein the light guide is configured with a plurality of optical fibers.
8. The charged particle beam device according to claim 1 , wherein:
the light guide is extended to bottom of an objective lens of the charged particle optical system, and
the light guide is disposed above the sample.
9. A detector equipped in a charged particle beam device, the charged particle beam device comprising:
a charged particle source;
a charged particle optical system which focuses a primary charged particle beam emitted from the charged particle source to scan a sample therewith; and
a sample chamber which is capable of keeping its inside with a constant gas pressure,
wherein the detector comprises:
an electrode to which a positive voltage is applied; and
a light guide which can transmit therethrough light at least ranging from a vacuum ultraviolet light region to a visible light region,
wherein the detector detects, by the light guide, light of gas scintillation generated by the electrode.
10. The detector according to claim 9 , wherein a material of the light guide is quartz.
11. The detector according to claim 9 , wherein the light of gas scintillation is derived from nitrogen molecules.
12. The detector according to claim 9 , wherein a voltage of the electrode and a gas pressure of the sample chamber are controlled by selection of an optimal condition table which is obtained in advance.
13. The detector according to claim 9 , wherein shape of the electrode is a mesh-like pattern, a ring-like pattern, a plate-like pattern, or a multi-bar-like pattern.
14. The detector according to claim 9 , wherein light from a side surface of the light guide is detected.
15. The detector according to claim 9 , wherein the light guide is configured with a plurality of optical fibers.
16. The detector according to claim 9 , wherein:
the light guide is extended to bottom of an objective lens of the charged particle optical system, and
the light guide is disposed above the sample.