Electron microscope
View Patent ↗An object of the present invention relates to measurement of a quantitative element image with a high S/N ratio and measurement of an electron energy loss spectrum with high energy precision and energy resolution. The present invention relates to measurement of a characteristic X-ray spectrum obtained by correcting dead time due to excessive X rays and measurement of an electron energy loss spectrum obtained by correcting energy based on a zero loss peak in the case where the characteristic X-ray spectrum and the electron energy loss spectrum are measured by irradiating one irradiation position on a sample with an electron beam for a predetermined time while scanning the surface of the sample to observe a Z-contrast image. According to the present invention, it becomes possible to measure a quantitative element image with a high S/N ratio by a characteristic X ray, an element image with a high S/N ratio by an electron energy loss spectrum and a high energy resolution spectrum.
1. An electron microscope, comprising:
an electron beam irradiation device for irradiating a sample with an electron beam emitted from an electron beam source;
an electron energy loss spectrometer for analyzing energy of an electron beam made of inelastic scattering electrons transmitted through the sample; and
a control device for controlling the electron beam irradiation device and the electron energy loss spectrometer and obtaining an image relating to the sample, wherein
the control device is configured to:
control the electron beam irradiation device so that one irradiation position on the sample is irradiated with the electron beam for a predetermined irradiation time;
divide the predetermined irradiation time into a plurality of time intervals;
obtain electron energy loss spectra for a plurality of different energy ranges within the predetermined irradiation time, wherein one electron energy loss spectrum is obtained for each of the plurality of time intervals, and the energy range for an electron energy loss spectrum for a first one of the time intervals is different from an energy range for an electron energy spectrum for another one of the time intervals that is time adjacent to the first one of the time intervals;
for each energy range, integrate the electron energy loss spectra obtained during the predetermined irradiation time for the respective energy range;
and
connect each of the integrated electron energy loss spectra using an energy range as a transverse axis to generate a connected electron energy loss spectrum.
2. The electron microscope according to claim 1 , further comprising a characteristic X-ray spectrometer for detecting a characteristic X ray emitted from the sample by irradiation of the electron beam and outputting a characteristic X-ray spectrum, wherein the control device is configured to obtain a characteristic X-ray spectrum detected by the characteristic X-ray spectrometer in the predetermined irradiation time.
3. The electron microscope according to claim 1 , wherein the electron energy loss spectra obtained in the predetermined time include an electron energy loss spectrum including a core loss peak of an element that is an analysis target, and the control device is configured to obtain the electron energy loss spectrum having a same energy range a plurality of times in the predetermined irradiation time.
4. The electron microscope according to claim 1 , wherein one of the electron energy loss spectra obtained in the predetermined time is an electron energy loss spectrum including a zero loss, the electron loss spectrometer includes a spectrum detector that detects an amount of energy shift between an energy reference position predefined as a zero loss reference position and a pixel position at a zero loss peak, and the control device is configured to:
correct energy of the electron energy loss spectra based on the amount of energy shift to generate corrected electron energy loss spectra;
for each energy range, integrate the corrected electron energy loss spectra obtained for the respective energy range; and
connect the corrected and integrated electron energy loss spectra to generate the connected electron energy loss spectrum.
5. The electron microscope according to claim 1 , wherein the electron energy loss spectra obtained in the predetermined irradiation time include an electron energy loss spectrum including a core loss peak of an element that is an analysis target, and the control device is configured to integrate the electron energy loss spectra having a same energy range whose energy is corrected a plurality of times.
6. The electron microscope according to claim 1 , wherein the electron energy loss spectra obtained in the predetermined irradiation time include a zero loss spectrum, a first core loss spectrum, and a second core loss spectrum.