IP Library Granted Patent US 7,205,550
Granted Patent B2
US 7,205,550 · App. 11/450,382 · Granted Apr 17, 2007

Electron beam apparatus and method for production of its specimen chamber

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Quick Facts
Patent No.
US 7,205,550
App. No.
11/450,382
Granted
Apr 17, 2007
Kind
B2
Abstract

A structure of an electron beam apparatus having shielding properties for shielding against an environmental magnetic field is provided. The electron beam apparatus comprises a mirror barrel for housing a magnetic lens for converging an electron beam onto a specimen and a specimen chamber for housing the specimen, wherein a non-magnetic material having conductivity is used as a material for at least one of the mirror barrel and a main body of the specimen chamber. The material for the mirror barrel or the main body of the specimen chamber is an aluminum alloy and a thickness of a sidewall of the mirror barrel or the main body of the specimen chamber is 10 mm or more. A magnetic plate having a thickness smaller than that of the sidewall of the mirror barrel or the main body of the specimen chamber is provided on an inner sidewall of the mirror barrel or the main body of the specimen chamber.

Claims (11)

1. An electron beam apparatus comprising:

a mirror barrel for housing a magnetic lens for converging an electron beam onto a specimen; and

a specimen chamber for housing the specimen;

wherein a non-magnetic material having conductivity is used as a material for at least one of the mirror barrel and a main body of the specimen chamber; and

wherein a thickness of the main body of the specimen chamber is thick enough to provide shielding properties against an AC magnetic field in an outer side of the specimen chamber.

2. The electron beam apparatus according to claim 1 ,

wherein a magnetic metal is set at outside or inside of the main body of the specimen chamber, a thickness of the magnetic metal is thinner than the thickness of the main body of the specimen chamber and provides shielding properties against a DC magnetic field.

3. The electron beam apparatus according to claim 2 ,

wherein the magnetic metal is a plate and is set at least one of an inner wall and outer wall of the main body of the specimen chamber.

4. The electron beam apparatus according to claim 1 ,

wherein the main body comprises aluminum.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →