Charged particle beam apparatus
View Patent ↗The invention has an object to provide a charged particle beam device in which it is possible to perform proper beam adjustment while suppressing a decrease in MAM time, with a simple configuration without adding a lens, a sensor, or the like. In order to achieve the above object, according to the invention, there is provided a charged particle beam device including: an optical element which adjusts a charged particle beam emitted from a charged particle source; an adjustment element which adjusts an incidence condition of the charged particle beam with respect to the optical element; and a control device which controls the adjustment element, wherein the control device determines a difference between a first feature amount indicating a state of the optical element based on the condition setting of the optical element, and a second feature amount indicating a state where the optical element reaches based on the condition setting and executes adjustment by the adjustment element when the difference is greater than or equal to a predetermined value.
1. A charged particle beam device comprising:
an optical element which adjusts a charged particle beam emitted from a charged particle source;
an adjustment element which adjusts an incidence condition of the charged particle beam with respect to the optical element; and
a control device which controls the adjustment element,
wherein the control device determines a difference between a first feature amount indicating a state of the optical element based on the condition setting of the optical element, and a second feature amount indicating a state where the optical element reaches based on the condition setting and executes adjustment by the adjustment element when the difference is greater than or equal to a predetermined value.
2. The charged particle beam device according to claim 1 , wherein the feature amount relates to a temperature of the optical element.
3. The charged particle beam device according to claim 1 , wherein the difference between the first feature amount and the second feature amount indicates the extent of deviation from an equilibrium temperature of the optical element.
4. The charged particle beam device according to claim 1 , wherein the control device continuously tracks temperature fluctuation of the optical element.
5. The charged particle beam device according to claim 1 , wherein the control device measures a lapse of time from a previous adjustment time by the adjustment element, and executes the adjustment by the adjustment element in a case where the elapsed time is greater than or equal to a predetermined value.
6. The charged particle beam device according to claim 1 , wherein the control device executes adjustment using the adjustment element in a case where a difference between a feature amount of the optical element when previous adjustment by the adjustment element is performed, and a feature amount of the optical element when an irradiation point of the charged particle beam is positioned at a predetermined position on a sample, is greater than or equal to a predetermined value.
7. A charged particle beam device comprising:
an optical element which adjusts a charged particle beam emitted from a charged particle source;
an adjustment element which adjusts an incidence condition of the charged particle beam with respect to the optical element; and
a control device which controls the adjustment element,
wherein the control device executes adjustment by the adjustment element when deviation from an equilibrium state of the optical element is greater than or equal to a predetermined value, and does not execute adjustment by the adjustment element in a case where the deviation is less than a predetermined value.