Scanning electron microscope having time constant measurement capability
View Patent ↗In a scanning electron microscope, an optimum scanning method for reducing the amount of deflection of a primary electron beam and secondary electrons is determined to acquire stable images. An energy filter is used to discriminate between energy levels. The change in yield of obtained electrons is used to measure the variation in specimen potential. The time constant of charging created during electron beam irradiation is extracted. The scanning method is optimized based on the extracted time constant to reduce the distortion and magnification variation that appear in a SEM image.
1. A scanning electron microscope in which a specimen is irradiated with a primary electron beam to acquire an image of the specimen, the scanning electron microscope comprising:
a deflector, which scans the specimen with the primary electron beam:
an energy filter, which selectively permits electrons having more than a predetermined energy level among the electrons emitted from the specimen to pass;
a detector, which outputs a detection signal based on the electrons that have passed through the energy filter; and
a scanning order determination device, which determines a scanning order of a scanning line of the deflector, the scanning order being determined in response to a temporal change of an intensity of the detection signal outputted from the detector.
2. The scanning electron microscope according to claim 1 , wherein the scanning order determination device determines the scanning order by selecting one of plural scanning patterns in response to the temporal change of the intensity of the detection signal.
3. The scanning electron microscope according to claim 1 , further comprising a time constant extraction device that measures the temporal change of the intensity of the detection signal.
4. The scanning electron microscope according to claim 3 , wherein the time constant extraction device measures the temporal change of the intensity of the detection signal based on a change in yield of the electrons detected by the detector where a filter voltage of the energy filter is set to a fixed value.
5. The scanning electron microscope according to claim 1 , wherein the deflector scans the specimen with the primary electron beam at a scanning interval that varies in response to the temporal change of the intensity of the detection signal.