IP Library Granted Patent US 8,710,430
Granted Patent B2
US 8,710,430 · App. 13/527,619 · Granted Apr 29, 2014

Mass spectrometry method

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,710,430
App. No.
13/527,619
Granted
Apr 29, 2014
Kind
B2
Abstract

A mass spectrometry method that corrects the effects from space charge and that achieves both sensitivity and a dynamic range. The mass axis of the mass spectrum is corrected based on the counts of ions accumulated within the ion trap at the point in time each ion was extracted.

Claims (18)

1. A mass spectrometry method comprising:

ionizing a sample with an ion source;

accumulating the ions in an ion trap; and

acquiring the mass spectrum by ejecting ions selectively by mass from the ion trap and detecting the ions by a detector,

wherein the mass axis of the mass spectrum is corrected based on the counts of ions accumulated within the ion trap at the point in time that each ion was extracted.

2. The mass spectrometry method according to claim 1 ,

wherein a valve to discontinuously introduce ions into the ion trap is provided so that the opening and closing of the valve discontinuously introduces the ions into the ion trap.

3. The mass spectrometry method according to claim 1 , comprising the step of:

ejecting a portion of the ions within the ion trap, between the steps of accumulating the ions and acquiring the mass spectrum.

4. The mass spectrometry method according to claim 1 ,

wherein an alternating current voltage is applied to the ion trap to resonance-excite and eject ions selected by mass in the step of acquiring the mass spectrum.

5. The mass spectrometry method according to claim 4 ,

wherein the frequency of the alternating current voltage to resonance-excite the ions is scanned in the step of acquiring the mass spectrum.

6. The mass spectrometry method according to claim 4 ,

wherein by utilizing an alternating current voltage that forms the potential to trap the ions in the ion trap, the amplitude of the alternating current voltage that forms the potential to trap ions is scanned in the process for acquiring the mass spectrum.

7. The mass spectrometry method according to claim 1 ,

wherein the mass axis of the mass spectrum is corrected utilizing the signal intensity of each ion accumulated in the ion trap at the point in time the ion for correction was extracted, with a value weighted for the space charge effect each ion exerts on the ion for correction.

8. The mass spectrometry method according to claim 1 , wherein a control part storing a list including information on the mass of the precursor ions is provided so that the presence or absence of a precursor ions in the list is judged from the corrected mass spectrum based on the ions accumulated in the ion trap at the point in time each ion was extracted, and tandem mass spectrometry measurement is performed.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2012
From: SUGIYAMA, MASUYUKI; HASHIMOTO, YUICHIRO; KUMANO, SHUN; KAWAGUCHI, YOHEI; MOROKUMA, HIDETOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 028407/0004 →