Test apparatus

1. An apparatus for obtaining image information of an area to be tested by irradiating a sample with an electron beam while performing a scan along a plurality of lines using a scanning electronic microscope for emitting an electron beam to a sample, detecting secondary electrons released from the sample, transforming a detection signal to an image signal, displaying the image signal on a screen, and observing the sample,

wherein a two-dimensional coordinate generating unit for performing a scan with the electron beam is constructed by a coordinate transforming unit for transforming coordinates in each of a horizontal (X) direction and a vertical (Y) direction, and the area to be tested is scanned with the electron beam in an arbitrary direction.

2. The apparatus according to claim 1 , wherein the coordinate transforming unit for transforming coordinates in each of the horizontal (X) direction and the vertical (Y) direction is constructed by a transformation table (LUT) for transforming X and Y coordinates as a reference to arbitrary scan coordinates.

3. The apparatus according to claim 2 , further comprising a sorting unit that sorts image data scanned in an arbitrary direction to an order of a scan in a normal predetermined direction on the basis of the scan coordinates generated by the coordinate generating unit,

the sorting unit has a sorting memory having a capacity equal to a capacity of image data in the area to be tested, a memory control unit for writing data to the sorting memory using the scan coordinates as a memory address, and an image range detecting unit for detecting an image computation range from the scan coordinates, and

the sorting unit transfers the image data per image computation range, thereby performing high-speed sorting and transfer.

4. The apparatus according to claim 1 , wherein the coordinate transforming unit is constructed by a small-capacity transformation table (LUT) having a capacity equivalent to image size and transforming the X and Y coordinates as a reference to X and Y scan coordinates,

the coordinate generating unit has a large-capacity transformation table (LUT) that stores transformation data by scan types to address a plurality of scan types and has a capacity equal to a plurality of image sizes,

during a scan operation, coordinate transformation is performed at high speed using the small-capacity transformation table and,

during a scan stops, the transformation data is transferred from the large-capacity transformation table (LUT) to the small-capacity transformation table (LUT).

5. The apparatus according to claim 1 , wherein the coordinate transforming unit is constructed by two or more first small-capacity transformation tables (LUTs) and two or more second small-capacity transformation tables (LUTs) each transforming X and Y coordinates as a reference to X and Y scan coordinates,

the coordinate generating unit has a large-capacity transformation table (LUT) that stores transformation data by scan types to address a plurality of scan types and has a capacity equal to a plurality of image sizes,

during a scan operation, coordinate transformation is performed with the first small-capacity transformation tables (LUTs) and the transformation data is transferred from the large-capacity transformation table (LUT) to the second small-capacity transformation tables (LUTs) and,

after completion of the scan, input/output signals of the first small-capacity transformation tables (LUTs) and input/output signals of the second small-capacity transformation tables are switched, and

the two or more small-capacity transformation tables (LUT) are alternately used per scan.

6. The apparatus according to claim 1 , comprising a mode of acquiring an image while performing a scan with the electron beam always in a predetermined direction and a mode of acquiring an image while performing a scan with the electron beam in an arbitrary direction,

wherein the image acquisition modes are switched according to a charging characteristic of the sample.

7. The apparatus according to claim 6 , further comprising a display unit for displaying a GUI screen,

wherein the image acquisition modes are switched according to the charging characteristic of the sample on the GUI screen, and the image acquisition mode is confirmed.

8. An apparatus using an electron beam, comprising:

a scanning electron microscope for scanning a sample with the electron beam and detecting secondary electrons released from the sample;

an image processing system for generating a scan coordinate control signal to be applied to the scanning electron microscope to perform a scan with the electron beam, and processing image data in an area to be tested in the sample, which is obtained by detecting the secondary electrons; and

a display unit for displaying a result of the process on the image data in the image processing system,

wherein the image processing system has a coordinate generating unit including a coordinate transforming unit for transforming basic coordinates to scan coordinates in each of a horizontal (X) direction and a vertical (Y) direction in order to generate the scan coordinate control signal, and

the area to be tested is scanned with the electron beam in an arbitrary direction.

9. The apparatus according to claim 8 , wherein the coordinate transforming unit is a transformation table (LUT) for transforming the basic coordinates to the scan coordinates in each of the horizontal (X) direction and the vertical (Y) direction.

10. The apparatus according to claim 8 , wherein the coordinate transforming unit has a small-capacity transformation table (LUT) for transforming the basic coordinates to the scan coordinates in each of the horizontal (X) direction and the vertical (Y) direction and corresponding to the area to be tested,

the coordinate generating unit has a large-capacity transformation table (LUT) for storing coordinate transformation data by a plurality of scan types,

during a scan operation, coordinate transformation is performed with the small-capacity transformation table and,

during a scan stops, the coordinate transformation data is transferred from the large-capacity transformation table (LUT) to the small-capacity transformation table (LUT).

11. The apparatus according to claim 8 , wherein the coordinate transforming unit has two or more first small-capacity transformation tables (LUTs) and two or more second small-capacity transformation tables (LUTs) each transforming the basic coordinates to the scan coordinates in each of a horizontal (X) direction and a vertical (Y) direction and corresponding to the area to be tested,

the coordinate generating unit has a large-capacity transformation table (LUT) that stores coordinate transformation data by a plurality of scan types,

during a scan operation, coordinate transformation is performed with the first small-capacity transformation tables (LUTs) and, simultaneously, the coordinate transformation data is transferred from the large-capacity transformation table (LUT) to the second small-capacity transformation tables (LUTs) and,

after completion of the scan, the first small-capacity transformation tables (LUTs) and the second small-capacity transformation tables are switched, and

the two or more small-capacity transformation tables (LUTs) are switched and used per scan.

12. The apparatus according to claim 8 , wherein the image processing system has an image data sorting unit to which image data is input, and

the image data sorting unit sorts the image data obtained by a scan with the electron beam in an arbitrary direction to an order of a scan in a predetermined direction on the basis of the scan coordinates output from the coordinate transforming unit.

13. The apparatus according to claim 12 , wherein the image processing system has an image computing unit to which image data output from the image data sorting unit is input and which performs image computation on the image data output,

the image data sorting unit has a sorting memory having a capacity equal to a capacity of the image data in the area to be tested, a memory control unit for writing data to the sorting memory using the scan coordinates as a memory address, and an image range detecting unit for detecting an image computation range by the image computing unit on the basis of the scan coordinates, and

the image data is transferred to the image computing unit per image computation range by the image computing unit.

14. A test apparatus using an electron beam, comprising:

a scanning electron microscope for scanning a sample with the electron beam and detecting secondary electrons released from the sample;

an image processing system for generating a control signal for performing a two-dimensional scan with the electron beam, to be applied to the scanning electron microscope, and processing image data in an area to be tested in the sample, obtained by detecting the secondary electrons; and

a display unit for displaying a result of the process on the image data in the image processing system,

wherein the image processing system has a coordinate generating unit for generating scan coordinates in each of a horizontal (X) direction and a vertical (Y) direction, and

the coordinate generating unit has a transformation table having a capacity corresponding to the area to be tested and transforming basic coordinates to the scan coordinates in each of the horizontal (X) direction and the vertical (Y) direction, and a storing unit for storing coordinate transformation data by a plurality of scan types.

15. The apparatus according to claim 14 , wherein the image processing system has an image data sorting unit to which the image data is input, and the image data sorting unit sorts the image data obtained by performing a scan with the electron beam in an arbitrary direction to an order of a scan in a predetermined direction on the basis of the scan coordinates output from the coordinate generating unit.