IP Library › Granted Patent US 7,209,589
Granted Patent B1
US 7,209,589 · App. 11/322,560 · Granted Apr 24, 2007

Method and apparatus for measuring dimension using electron microscope

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Quick Facts
Patent No.
US 7,209,589
App. No.
11/322,560
Granted
Apr 24, 2007
Kind
B1
Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 2, 2006
From: SHISHIDO, CHIE; IWASAKI, MAYUKA; KAWADA, HIROKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 017630/0866 →