Assignment of Assignor's Interest

Recorded: 2006-03-02 Pages: 2

Assignors

SHISHIDO, CHIE

Executed: 2006-01-13

IWASAKI, MAYUKA

Executed: 2005-12-29

KAWADA, HIROKI

Executed: 2006-01-11

Assignee

24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Method and Apparatus for Measuring Dimension Using Electron Microscope

Patent: 7,269,287 →

Application: 11/322,560 →

Publication: US 2007/0092130

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.