Scanning electron microscope
View Patent ↗A scanning electron microscope capable of securing a high ion detection efficiency in spite of a short working distance and the adaptability for high resolution is disclosed. An ion detector for detecting ions is arranged nearer to an electron source than a first pressure limiting aperture for maintaining the specimen chamber in a predetermined vacuum. This configuration makes it possible to achieve the high resolution of the semi-in-lens objective lens on one hand and to detect the ions generated by the collision between the secondary electrons and the gas molecules on the other hand.
1. A scanning electron microscope comprising:
an electron source;
an objective lens for focusing the electron beam emitted from the electron source on a specimen;
a specimen chamber with the specimen arranged therein;
a first pressure limiting aperture having an opening for passing the electron beam to maintain the specimen chamber at a predetermined vacuum degree; and
an ion detector arranged nearer to the electron source than the principal plane of the objective lens to detect the ions generated by the collision between the secondary electrons released from the specimen and the gas molecules;
wherein the first pressure limiting aperture is arranged in the lens magnetic field formed by the objective lens.
2. A scanning electron microscope according to claim 1 ,
wherein a second pressure limiting aperture having an opening for passing the electron beam is arranged between the ion detector and the electron source.
3. A scanning electron microscope according to claim 2 , further comprising:
a vacuum pump for evacuating the space between the first pressure limiting aperture and the second pressure limiting aperture.
4. A scanning electron microscope according to claim 2 ,
wherein a gas atmosphere is formed between the first pressure limiting aperture and the second pressure limiting aperture, and maintained in such a state that ions are generated by the collision with the secondary electrons released from the specimen.
5. A scanning electron microscope according to claim 2 ,
wherein the pressure of the space between the first pressure limiting aperture and the second pressure limiting aperture is regulated to a value between 10 Pa and 150 Pa.
6. A scanning electron microscope according to claim 1 , further comprising:
an electrode for attracting the secondary electrons is arranged between the principal plane of the lens and the first pressure limiting aperture.