Multi-charged beam lens and charged beam exposure apparatus using the same

1. A multi-charged beam lens formed by stacking via insulators at least three substrates each having a plurality of apertures which pass charged beams, the lens comprising:

a voltage application portion arranged on at least one of the at least three substrates,

wherein said voltage application portion and the insulators are connected via an insulating portion consisting of an oxide material in order to achieve electrical isolation between said voltage application portion and the insulators.

2. The lens according to claim 1 , wherein the portion of the substrate that is in contact with the insulator is the insulating portion.

3. The lens according to claim 1 , wherein the at least one substrate further comprises a semiconductor portion insulated from the voltage application portion, and the semiconductor portion is in contact with the insulator.

4. The lens according to claim 3 , wherein the semiconductor portion is coated with an insulating layer.

5. The lens according to claim 1 , wherein the voltage application portion is formed by forming a conductive film on the substrate.

6. The lens according to claim 5 , wherein the conductive film is made of a noble metal.

7. The lens according to claim 1 , wherein the insulating portion is made of silicon dioxide.

8. The lens according to claim 1 , wherein a material for the substrate is one of a conductor and a semiconductor.

9. The lens according to claim 1 , wherein each of the at least three electrode substrates has an alignment recessed portion in a surface in contact with the insulator, and the insulator is arranged in the recessed portion.

10. The lens according to claim 9 , wherein the recessed portion is shaped into a groove.

11. The lens according to claim 1 , wherein the insulator is shaped into a cylinder.

12. A charged beam exposure apparatus which exposes a substrate to be exposed using a charged beam, the apparatus comprising:

a charged beam source which emits a charged beam;

a first electron optical system which forms a plurality of intermediate images of said charged beam source;

a second electron optical system which projects the plurality of intermediate images formed by said first electron optical system onto a substrate to be exposed; and

an alignment apparatus which holds and drives the substrate to be exposed to a predetermined position, and aligns the substrate,

wherein said first electron optical system uses a multi-charged beam lens formed by stacking via insulators at least three substrates each having a plurality of apertures which pass charged beams, and the multi-charged beam lens has a voltage application portion arranged on at least one of the at least three substrates and the voltage application portion and the insulators are connected via an insulating portion consisting of an oxide material in order to achieve electrical isolation between the voltage application portion and the insulators.

13. A device manufacturing method, comprising:

an exposure step of exposing a substrate to be exposed to a pattern using a charged beam exposure apparatus as defined in claim 12 ; and

a development step of developing the substrate which has been exposed to the pattern in the exposure step.

14. An electrostatic lens for a charged beam, the lens comprising:

a plurality of substrates each having at least one aperture; and

spacers arranged between said plurality of substrates,

wherein at least one of said plurality of substrates has an electrode portion which controls a trajectory of the charged beam passing through the aperture and the voltage application portion and the insulators are connected via an insulating portion consisting of an oxide material in order to achieve electrical isolation between the voltage application portion and the insulators.

15. A charged beam exposure apparatus, comprising:

a charged beam source; and

an electrostatic lens, the electrostatic lens having a plurality of substrates each having at least one aperture and spaces arranged between the plurality of substrates, wherein at least one of the plurality of substrates has an electrode portion for controlling a trajectory of the charged beam passing through the aperture and the voltage application portion and the insulators are connected via an insulating portion consisting of an oxide material in order to achieve electrical isolation between the voltage application portion and the insulators.

16. A device manufacturing method, comprising:

an exposure step of exposing a substrate to be exposed to a pattern using a charged beam exposure apparatus as defined in claim 15 ; and

a development step of developing the substrate which has been exposed to the pattern in the exposure step.