IP Library Granted Patent US 7,435,958
Granted Patent B2
US 7,435,958 · App. 11/356,438 · Granted Oct 14, 2008

Electron beam apparatus and method for production of its specimen chamber

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Quick Facts
Patent No.
US 7,435,958
App. No.
11/356,438
Granted
Oct 14, 2008
Kind
B2
Abstract

A structure of an electron beam apparatus having shielding properties for shielding against an environmental magnetic field is provided. The electron beam apparatus comprises a mirror barrel for housing a magnetic lens for converging an electron beam onto a specimen and a specimen chamber for housing the specimen, wherein a non-magnetic material having conductivity is used as a material for at least one of the mirror barrel and a main body of the specimen chamber. The material for the mirror barrel or the main body of the specimen chamber is an aluminum alloy and a thickness of a sidewall of the mirror barrel or the main body of the specimen chamber is 10 mm or more. A magnetic plate having a thickness smaller than that of the sidewall of the mirror barrel or the main body of the specimen chamber is provided on an inner sidewall of the mirror barrel or the main body of the specimen chamber.

Claims (5)

1. A specimen chamber for an electron beam apparatus comprising a mirror barrel for housing a magnetic lens for converging an electron beam onto a specimen, said specimen chamber for housing said specimen, said specimen chamber comprising:

a main body comprising a non-magnetic material having conductivity, comprising a plurality of rounded inner corners, and comprising a bottom and sidewalls integrally formed by engraving and milling, and an inner plate made from a highly magnetic permeable material inside of said sidewalls,

wherein said sidewalls of said main body have a thickness of at least 35 mm for reflecting and attenuating an AC magnetic field of an environmental magnetic field, and wherein said inner plate has a thickness of at least 1 mm for absorbing, or allowing to pass through, part of the AC magnetic field and a DC magnetic field of said environmental magnetic field.

2. The specimen chamber according to claim 1 , wherein said main body comprises aluminum.

3. The specimen chamber according to claim 1 , wherein said inner plate comprises magnetic plating formed on said sidewalls of said main body.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →