Scanning electron microscope and a method for imaging a specimen using the same
View Patent ↗(1) part or all of the number, coordinates and size/shape and imaging sequence of imaging points each for observation, the imaging position change method and imaging conditions can be calculated automatically from CAD data, (2) a combination of input information and output information for imaging recipe creation can be set arbitrarily, and (3) decision is made of imaging or processing at an arbitrary imaging point as to whether to be successful/unsuccessful and in case a failure is determined, a relief process can be conducted in which the imaging point or imaging sequence is changed.
1. A method for imaging by a scanning electron microscope system, the method comprising the steps of:
inputting, into the system, coordinates of a plurality of evaluation points of a specimen to be inspected;
setting a plurality of addressing points, wherein an addressing direction of an element in a first addressing point differs from an addressing direction of an element in a second addressing point;
determining an imaging sequence that includes the plurality of evaluation points and the plurality of addressing points; and
imaging the specimen to be inspected, according to the imaging sequence.
2. A method of imaging according to claim 1 , wherein the plurality of addressing points include: a first addressing point with an element disposed in an x-axis addressing direction, and a second addressing point with an element disposed in a y-axis addressing direction, or vice versa.
3. A method of imaging according to claim 1 , wherein a design layout of the specimen is rendered as an input, and the respective positions of the plurality of addressing points, are determined in accordance with the design layout.
4. A method of imaging according to claim 3 , wherein a determination of whether or not there an addressing point exists is set as each evaluation point is inspected.
5. A scanning electron microscope system, comprising:
an inputting means for inputting, into the system, coordinates of a plurality of evaluation points of a specimen to be inspected;
a setting means for setting a plurality of addressing points, wherein an addressing direction of an element in a first addressing point differs from an addressing direction of an element in a second addressing point;
a determining means for determining an imaging sequence that includes the plurality of evaluation points and the plurality of addressing points; and
an imaging means for imaging the specimen to be inspected, according to the imaging sequence.
6. A scanning electron microscope system according to claim 5 , wherein the plurality of addressing points include: a first addressing point with an element disposed in an x-axis addressing direction, and a second addressing point with an element disposed in a y-axis addressing direction, or vice versa.
7. A scanning electron microscope system according to claim 5 , wherein a design layout of the specimen is rendered as an input, and the respective positions of the plurality of addressing points, are determined in accordance with the design layout.
8. A scanning electron microscope system according to claim 7 , wherein a determination of whether or not an addressing point exists is set as each evaluation point is inspected.
9. A method of imaging according to claim 2 , wherein the plurality of addressing points include an addressing point with both an element disposed in an x-axis addressing direction and an element disposed in a y-axis addressing direction.
10. A scanning electron microscope system according to claim 6 , wherein the plurality of addressing points include an addressing point with both an element disposed in an x-axis addressing direction and an element disposed in a y-axis addressing direction.