Specimen inspection equipment and how to make electron beam absorbed current images
View Patent ↗An object of the present invention is to obtain a clear absorbed current image without involving the difference in gain of amplifier between inputs, from absorbed currents detected by using a plurality of probes and to improve measurement efficiency. In the present invention, a plurality of probes are brought in contact with a specimen. While irradiating the specimen with an electron beam, currents flowing in the probes are measured. Signals from at least two probes are input to a differential amplifier. An output of the differential amplifier is amplified. On the basis of the amplified output and scanning information of the electron beam, an absorbed current image is generated. According to the invention, a clear absorbed current image can be obtained without involving the difference in gain of amplifier between inputs. Thus, measurement efficiency in a failure analysis of a semiconductor device can be improved.
1. A specimen inspection equipment comprising:
a specimen stage on which a specimen can be mounted;
an electron optics capable of emitting an electron beam;
a detector capable of detecting secondary electrons generated from said specimen;
a plurality of probes which can be brought into contact with said specimen;
a measuring instrument capable of measuring current flowing in said plurality of probes;
a differential amplifier to which signals from said measuring instrument are supplied; and
an imaging device for outputting an absorbed current image on the basis of both a signal from said differential amplifier and a signal depending on a scanning of said electron optics.
2. The specimen inspection equipment according to claim 1 , further comprising a cable for connecting said plurality of probes and said differential amplifier, and the cable is shielded from a magnetic field.
3. The specimen inspection equipment according to claim 1 , wherein said specimen is a semiconductor device on which a pattern is formed.
4. A specimen inspection equipment comprising:
a specimen stage on which a specimen can be mounted;
an electron optics capable of emitting an electron beam;
a detector capable of detecting secondary electrons generated from said specimen;
at least two probes which can be brought into contact with said specimen;
a measuring instrument capable of measuring current flowing in said probes;
an amplifier to which a signal from said measuring instrument is supplied; and
an imaging device for outputting an absorbed current image on the basis of both a signal from said amplifier and a signal depending on a scan of said electron optics,
wherein a signal depending on current flowing in one of the probes is supplied to the input side of the amplifier, and a signal depending on current flowing in the other probe is supplied to the GND of the amplifier.
5. The specimen inspection equipment according to claim 4 , wherein said specimen is a semiconductor device on which a pattern is formed.
6. A method of generating an absorbed current image, comprising the steps of:
irradiating a specimen with an electron beam, with a probe being apart from the specimen;
generating noise information on the basis of both a signal depending on current flowing in the probe and a signal depending on a scanning of electron optics;
irradiating the specimen with an electron beam, with the probe being in contact with the specimen;
generating absorbed current information on the basis of both a signal depending on current flowing in the probe and a signal depending on a scanning of the electron optics; and
generating an absorbed current image on the basis of said absorbed current information and said noise information.
7. The method of generating an absorbed current image according to claim 6 , wherein the polarity of said noise information is inverted, and the resultant is superimposed upon said absorbed current information, thereby generating an absorbed current image.
8. The method of generating an absorbed current image according to claim 6 , wherein said specimen is a semiconductor device on which a pattern is formed.