IP Library Granted Patent US 8,803,084
Granted Patent B2
US 8,803,084 · App. 13/726,294 · Granted Aug 12, 2014

Mass spectrometer and mass spectrometry

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Quick Facts
Patent No.
US 8,803,084
App. No.
13/726,294
Granted
Aug 12, 2014
Kind
B2
Abstract

A mass spectrometer featured in including an ion source including a first electrode, a second electrode, and a dielectric unit having a sample introducing unit and a sample discharging unit and provided between the first electrode and the second electrode, a power source of ionizing a sample by a discharge generated between the first electrode and the second electrode by applying an alternating current voltage to either one of the first electrode and the second electrode, a mass spectrometry unit of analyzing an ion discharged from the sample discharging unit, and a light irradiating unit of irradiating an area of generating the discharge with light.

Claims (27)

1. A mass spectrometer comprising:

an ion source including a first electrode, a second electrode, and an insulator, wherein the insulator is provided between the first electrode and the second electrode, and has a sample gas inlet and outlet;

a power source configured to apply an alternating current voltage to either one of the first electrode and the second electrode, and to generate a dielectric barrier discharge between the first electrode and the second electrode;

a mass spectrometry unit configured to analyze sample ions produced by the dielectric barrier discharge and extracted from the outlet of the ion source; and

a light irradiating unit configured to irradiate light on an area where the discharge is generated.

2. The mass spectrometer according to claim 1 , further comprising:

an irradiation controlling unit configured to control an illuminance of the light irradiated by the light irradiating unit,

wherein the illumination controlling unit is configured to lower the illuminance of the light irradiated by the light irradiating unit when the mass spectrometer analyzes the ion.

3. The mass spectrometer according to claim 2 , wherein the irradiation controlling unit is configured to switch off the light irradiating unit when the mass spectrometry unit analyzes the ion.

4. The mass spectrometer according to claim 2 , wherein the irradiation controlling unit is configured to switch on the light irradiating unit during a portion of a time period of applying the alternating current voltage, or a total of a time period of applying the alternating current voltage.

5. The mass spectrometer according to claim 2 , wherein the irradiation controlling unit is configured to switch on the light irradiating unit before applying the alternating current voltage, and is configured to lower the illuminance of the light irradiated by the light irradiating unit before finishing a state of applying the alternating current voltage.

6. The mass spectrometer according to claim 4 , wherein the sample is continuously introduced at the sample introducing unit.

7. The mass spectrometer according to claim 1 , further comprising:

a valve; and

a valve controlling unit configured to control a time period of opening the valve, and a time period of closing the valve.

8. The mass spectrometer according to claim 1 , wherein the light irradiating unit is installed at an inner portion of the ion source.

9. The mass spectrometer according to claim 1 , wherein a reflector is included at an inner portion of the ion source.

10. The mass spectrometer according to claim 1 , wherein the discharge is carried out at a Torr value within a range of Torr values from 2 to 300, inclusive of 2 and 300.

11. A spectrometry method, comprising:

a sample introducing step, of introducing a sample to a dielectric unit, the dielectric unit having a sample introducing unit and a sample discharging unit, and the dielectric unit being provided between a first electrode and a second electrode;

a voltage applying step, of applying an alternating current voltage to either one of the first electrode and the second electrode, by using a power source;

an ionizing step, of ionizing the sample in the dielectric unit, while using an irradiation controlling unit to irradiate light to an area between the first electrode and the second electrode; and

an analyzing step, of analyzing the ionized sample after a dielectric barrier discharge in the sample discharging unit of the dielectric unit.

12. The mass spectrometry according to claim 11 , wherein in the ionizing step, an illuminance of the irradiated light by the irradiation controlling unit is lowered before starting the analyzing step.

13. The mass spectrometry according to claim 12 , wherein in the analyzing step, the light is switched off by the irradiation controlling unit before starting the analyzing step.

14. The mass spectrometry according to claim 12 , wherein in the voltage applying step, the irradiation controlling unit switches on the light irradiating unit during a portion of a time period, or a total of a time period, of applying the alternating current voltage.

15. The mass spectrometry according to claim 12 , wherein in the ionizing step, the irradiation controlling unit switches on the light irradiating unit before applying the alternating current voltage at the voltage applying step, and lowers the illuminance of the light irradiated by the light irradiating unit before finishing a state of applying the alternating current voltage.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 24, 2012
From: NISHIMURA, KAZUSHIGE; HASHIMOTO, YUICHIRO; SUGIYAMA, MASUYUKI; YAMADA, MASUYOSHI; MOROKUMA, HIDETOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 029524/0332 →