Scanning electron microscope
View Patent ↗There is provided an electron microscope which can clearly detect a microscopic unevenness in a sample. According to a scanning electron microscope, when luminance signals from one pair of backscattered electron detectors are given by L and R, and when a luminance signal from a scattered electron detector is given by S, an adjustment value Lc of L and an adjustment value Rc of R are calculated by using primary homogeneous expressions of L, R, and S.
1. A scanning electron microscope having:
an electron beam irradiating system which irradiates an electron beam on a sample;
one pair of backscattered electron detectors which detects backscattered electrons from the sample; and
an image processing unit for calculating an adjustment value Lc for L and an adjustment value Rc for R by using first order homogeneous polynomial of luminance signals obtained by irradiating an electron beam, wherein said L corresponds to the luminance signal from one detector of said one pair of backscattered electron detectors and said R corresponds to the luminance signal from the other detector of said one pair of backscattered electron detectors, regarding the same region of the sample.
2. The scanning electron microscope according to claim 1 , having
a scattered electron detector which detects scattered electrons from the sample, wherein
the image processing unit, when a luminance signal from the scattered electron detector is given by S, calculates an adjustment value Lc of L and an adjustment value Rc of R by using first order homogeneous polynomial of L, R, and S.
3. The scanning electron microscope according to claim 2 , wherein
the first order homogeneous polynomial of L and R are expressed by the following expressions:
Lc=S +( L−R )
Rc=S +( R−L ).
4. The scanning electron microscope according to claim 2 , wherein
the first order homogeneous polynomial of L and R are expressed by the following expressions by using an arbitrary coefficient α(0≦α≦1):
Lc=α·S+ (1−α)·( L−R )
Rc=α·S+ (1−α)·( R−L ).
5. The scanning electron microscope according to claim 1 or 2 , having a display which receives the image data to display an electron microscope image, wherein
the display displays images generated by the adjustment value Lc of L and the adjustment value Rc of R on one screen at once.
6. The scanning electron microscope according to claim 5 , wherein
the display displays a screen having a GUI to set a coefficient α of the first order homogeneous polynomial.
7. The scanning electron microscope according to claim 1 , wherein
the first order homogeneous polynomial of L and R are expressed by the following equations:
Lc =( L−R )
Rc =( R−L ).
8. The scanning electron microscope according to claim 1 , wherein
the first order homogeneous polynomial of L and R are expressed by the following equations:
Lc =( L+R )/2+( L−R )
Rc =( L+R )/2+( R−L ).
9. The scanning electron microscope according to claim 1 , wherein
the first order homogeneous polynomial of L and R are expressed by the following expressions by using an arbitrary coefficient α(0≦α≦1):
Lc =( L+R )/2+α·( L−R )
Rc =( L+R )/2+α·( R−L ).
10. The scanning electron microscope according to claim 1 , wherein
the first order homogeneous polynomial of L and R are expressed by the following expressions by using an arbitrary coefficient α(0≦α≦1):
Rc =α·( R−L )+ R
Lc =α·( L−R )+ L.
11. An image generating method using a scanning electron microscope comprising the steps of:
irradiating an electron beam on a sample;
detecting backscattered electrons from the sample by one pair of backscattered electron detector; and
calculating an adjustment value Lc for L and an adjustment value Rc for R by using a first order homogeneous polynomial of luminance signals, when luminance signals from the pair of backscattered electron detectors regarding the same region of the sample are given by L and R.
12. The image generating method using a scanning electron microscope according to claim 11 , having:
the step of detecting scattered electrons from the sample by a scattered electron detector; the step of, when a luminance signal from the scattered electron detector is given by S, calculating an adjustment value Lc of L and an adjustment value Rc of R by using first order homogeneous polynomial of L, R, and S.
13. The image generating method using a scanning electron microscope according to claim 12 , wherein
the first order homogeneous polynomial of L and R are expressed by the following expressions by using an arbitrary coefficient α(0≦α≦1):
Lc=α·S+ (1−α)·( L−R )
Rc=α·S+ (1−α)·( R−L ).
14. The image generating method using a scanning electron microscope according to claim 11 , wherein
the first order homogeneous polynomial of L and R are expressed by the following expressions by using an arbitrary coefficient α(0≦α≦1):
Lc =( L+R )/2+α·( L−R )
Rc =( L+R )/2+α·( R−L ).
15. The image generating method using a scanning electron microscope according to claim 11 or 12 , having
the step of displaying images generated by the adjustment value Lc of L and the adjustment value Rc of R on one screen at once.
16. The image generating method using a scanning electron microscope according to claim 11 or 12 , having
the step of displaying a screen having a GUI to set a coefficient α of the primary homogeneous expressions.
17. A charged particle beam apparatus having:
a charged particle beam irradiating system which irradiates a charged particle beam on a sample;
one pair of detectors which detect an information signal from the sample; and
an image processing unit which processes L image data and R image data obtained from each of the pair of detectors, respectively, and
calculates an adjustment value Lc for the L image data and an adjustment value Rc for the R image data by using first order homogeneous polynomial of luminance signals regarding the same region of the sample.