IP Library Granted Patent US 7,205,541
Granted Patent B1
US 7,205,541 · App. 11/305,231 · Granted Apr 17, 2007

Charged particle beam apparatus

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Quick Facts
Patent No.
US 7,205,541
App. No.
11/305,231
Granted
Apr 17, 2007
Kind
B1
Abstract

An object of this invention is to provide a charged particle beam apparatus that is capable of handling samples without adhering impurities onto the samples. In a scanning electron microscope in which a lubricant was coated on a sliding portion of a movable member that moves inside a vacuum chamber, a substance from which low molecular components were removed is used as the lubricant. It is thus possible to inhibit sample contamination and suppress the occurrence of defects in a process following measurement of the samples.

Claims (10)

1. A charged particle beam apparatus comprising a detector that detects a charged particle released from a sample that is irradiated by a charged particle beam, and a vacuum chamber that surrounds the sample that was irradiated by the charged particle beam,

wherein a lubricant that underwent heat purification at a temperature greater than or equal to 80° C. and less than 220° C. inside a vacuum is coated on a sliding part of a sliding member disposed inside the vacuum chamber.

2. The charged particle beam apparatus according to claim 1 , wherein the lubricant includes a fluorochemical compound.

3. The charged particle beam apparatus according to claim 2 , wherein the fluorochemical compound includes perfluoropolyether.

4. The charged particle beam apparatus according to claim 2 , wherein the lubricant is a substance from which a part of CF 3 , C 2 F 5 , and/or C 3 F 7 was removed by the heat purification.

5. The charged particle beam apparatus according to claim 1 , wherein the lubricant includes a hydrocarbon compound.

6. The charged particle beam apparatus according to claim 1 , wherein a kinetic viscosity of the lubricant is 400 to 700 mm 2 /s.

7. A charged particle beam apparatus comprising a detector that detects a charged particle released from a sample that is irradiated by a charged particle beam, and a vacuum chamber that surrounds the sample that was irradiated by the charged particle beam,

wherein a lubricant including perfluoropolyether is coated on a sliding part of a sliding member disposed inside the vacuum chamber and the lubricant has a kinetic viscosity of 400 to 700 mm 2 /s and is a substance that is obtained after undergoing a process that removes a part of CF 3 , C 2 F 5 , and/or C 3 F 7 .

8. The charged particle beam apparatus according to claim 7 , wherein the part of CF 3 , C 2 F 5 , and/or C 3 F 7 is removed by heat purification at a temperature greater than or equal to 80° C. and less than 220° C. inside a vacuum.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2006
From: MITO, HIROAKI; SASADA, KATSUHIRO; KATO, KAZUO; KUDO, TOMOHIRO; SAEKI, TOMONORI; YAHAGI, YASUO; KOBAYASHI, MASAYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 017623/0947 →