Mass spectrometer and method

1. A mass spectrometer device comprising:

a first calculation unit that calculates a total amount of ion in a mass spectrum output from a mass analysis unit;

a second calculation unit that calculates a half-value width of a representative peak selected from peaks of the mass spectrum; and

a control unit that determines a measurement method for use in a next round of measurement, on the basis of the total amount of ion and the half-value width of the representative peak;

wherein the second calculation unit calculates a half width at half maximum with respect to each of a low-mass side and a high-mass side of a top of the representative peak, and considers a value twice a value of the smaller of the half widths at half maximum to be the half-value width.

2. The mass spectrometer device according to claim 1 , wherein the second calculation unit, when either the half width at half maximum on the low-mass side or the half width at half maximum on the high-mass side cannot be calculated, considers a value twice the value of the half width at half maximum that can be calculated to be the half-value width; and

when the half width at half maximum cannot be calculated with respect to both the low-mass side and the high-mass side, the second calculation unit sets an invalid value for the half-value width.

3. The mass spectrometer device according to claim 2 , wherein the second calculation unit calculates the half-value width by determining one of a plurality of peaks appearing in the mass spectrum that has the highest intensity as being the representative peak; and

when the calculated half-value width is the invalid value, the second calculation unit calculates the half-value width by determining one of the plurality of peaks that has the next-highest intensity as being the representative peak.

4. The mass spectrometer device according to claim 1 , wherein the first calculation unit calculates the total amount of ion as a sum of intensity values of the mass spectrum.

5. A mass spectrometer device comprising:

a first calculation unit that calculates a total amount of ion in a mass spectrum output from a mass analysis unit;

a second calculation unit that calculates a half-value width of a representative peak selected from peaks of the mass spectrum; and

a control unit that determines a measurement method for use in a next round of measurement, on the basis of the total amount of ion and the half-value width of the representative peak;

wherein the control unit determines a state of the current round of measurement on the basis of a combination of a result of comparison of the total amount of ion measured with respect to the mass spectrum with one or a plurality of first threshold values, and a result of comparison of the half-value width of the representative peak measured with respect to the mass spectrum with one or a plurality of second threshold values.

6. The mass spectrometer device according to claim 5 , wherein the control unit determines the measurement method for use in the next round of measurement on the basis of the state of the current round of measurement.

7. A mass spectrometer device comprising:

a first calculation unit that calculates a total amount of ion in a mass spectrum output from a mass analysis unit;

a second calculation unit that calculates a half-value width of a representative peak selected from peaks of the mass spectrum; and

a control unit that determines a measurement method for use in a next round of measurement, on the basis of the total amount of ion and the half-value width of the representative peak;

wherein the control unit determines the stability of an ion source constituting the mass analysis unit on the basis of a result of comparison of a statistical amount of a plurality of total amounts of ion output from the mass analysis unit operated with a specific measurement parameter with a third threshold value.

8. The mass spectrometer device according to claim 7 , wherein when a maximum value of the plurality of total amounts of ion is zero, the control unit sets the statistical amount to zero; and

when the maximum value of the plurality of total amounts of ion is not zero, the control unit sets a value obtained by dividing a minimum value of the plurality of total amounts of ion by the maximum value as the statistical amount.

9. The mass spectrometer device according to claim 7 , wherein the control unit, upon determining that the operation of the ion source is unstable, executes a control operation for stabilizing the ion source;

upon determining that the operation of the ion source is stable, the control unit determines the state of the current round of measurement on the basis of a combination of a result of comparison of the total amount of ion measured with respect to the mass spectrum with one or a plurality of first threshold values, and a result of comparison of the half-value width of the representative peak measured with respect to the mass spectrum with one or a plurality of second threshold values.

10. The mass spectrometer device according to claim 9 , wherein a third calculation unit that executes a predetermined determination process on the basis of the mass spectrum does not execute the determination process or does not output a result of the determination process when it is determined that the operation of the ion source is unstable.

11. The mass spectrometer device according to claim 1 , wherein the control unit determines the appropriateness of the amount of ion in the ion trap constituting the mass analysis unit on the basis of a result of comparison of a maximum intensity of the mass spectrum and a detectable upper limit value of a detector constituting the mass analysis unit.

12. The mass spectrometer device according to claim 11 , wherein the control unit, when the maximum intensity corresponds to the upper limit value, executes a process for decreasing the amount of ion in the ion trap as the measurement method for use in the next round of measurement.

13. A mass spectrometer device comprising:

a mass analysis unit;

a first calculation unit that calculates a total amount of ion in a mass spectrum output from the mass analysis unit;

a second calculation unit that calculates a half-value width of a representative peak selected from peaks of the mass spectrum;

a control unit that determines a measurement method for use in a next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak and issues an instruction to the mass analysis unit; and

a user interface unit;

wherein the second calculation unit calculates a half width at half maximum with respect to each of a low-mass side and a high-mass side of a top of the representative peak, and considers a value twice a value of the smaller of the half widths at half maximum to be the half-value width.

14. A mass analysis method comprising:

a process of a first calculation unit calculating a total amount of ion in a mass spectrum output from a mass analysis unit;

a process of a second calculation unit calculating a half-value width of a representative peak selected from peaks appearing in the mass spectrum; and

a process of a control unit determining a measurement method for use in a next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak;

wherein the second calculation unit calculates a half width at half maximum with respect to each of a low-mass side and a high-mass side of a top of the representative peak, and considers a value twice a value of the smaller of the half widths at half maximum to be the half-value width.