Defect inspection device and defect inspection method

1. A defect inspection device comprising:

an irradiation unit having a light source that emits a laser beam, a first light-condensing unit that linearly condenses the laser beam emitted from the light source, an objective pupil optical unit that allows the illumination light linearly condensed by the first light-condensing unit to pass through, and an objective lens that allows the illumination light having passed through the objective pupil optical unit to pass through;

an irradiation position control unit that controls a passing position of the illumination light in the objective pupil optical unit disposed at a pupil surface of the objective lens;

a detection unit having a second light-condensing unit that condenses light irradiated by the irradiation unit and generated from a sample, a specular reflection light-blocking unit that blocks specular reflection light from the sample and light components generated near the pupil surface among the light beams condensed by the second light-condensing unit, and an image forming unit that images the light that is condensed by the second light-condensing unit and that is not blocked by the specular reflection light-blocking unit into a detector; and

a defect determination unit that detects a defect on a surface of the sample on the basis of a signal of the image imaged by the image forming unit;

wherein the objective pupil optical unit includes a spatial filter disposed on the pupil surface of the objective lens of the irradiation unit, and an illumination mirror disposed at a position apart from the spatial filter by a predetermination distance; and

wherein the spatial filter and the illumination mirror include angle rotation mechanisms.

2. The defect inspection device according to claim 1 ,

wherein the objective pupil optical unit includes a mirror that condenses the illumination light from the light-condensing unit.

3. The defect inspection device according to claim 1 ,

wherein the irradiation position control unit controls the passing position of the illumination light in the objective pupil optical unit by moving the mirror of the objective pupil optical unit and the light-condensing unit in a predetermined direction.

4. The defect inspection device according to claim 1 ,

wherein the first light-condensing unit includes a TTL illumination unit.

5. The defect inspection device according to claim 1 ,

wherein the objective lens of the irradiation unit and the second light-condensing unit of the detection unit are shared.

6. The defect inspection device according to claim 1 ,

wherein a plurality of illumination units are provided.

7. A defect inspection device comprising:

an irradiation unit having a light source that emits a laser beam, a first light-condensing unit that linearly condenses the laser beam emitted from the light source, an objective pupil optical unit that allows the illumination light linearly condensed by the first light-condensing unit to pass through, and an objective lens that allows the illumination light having passed through the objective pupil optical unit to pass through;

an irradiation position control unit that controls a passing position of the illumination light in the objective pupil optical unit disposed at a pupil surface of the objective lens;

a detection unit having a second light-condensing unit that condenses light irradiated by the irradiation unit and generated from a sample, a specular reflection light-blocking unit that blocks specular reflection light from the sample and light components generated near the pupil surface among the light beams condensed by the second light-condensing unit, and an image forming unit that images the light that is condensed by the second light-condensing unit and that is not blocked by the specular reflection light-blocking unit into a detector; and

a defect determination unit that detects a defect on a surface of the sample on the basis of a signal of the image imaged by the image forming unit

wherein the objective pupil optical unit includes a specular reflection light filter that is disposed at a position where the specular reflection light from the sample is blocked;

wherein the specular reflection light filter includes a position adjusting mechanism that can adjust a light-blocking position; and

wherein a light-blocking width is controlled by overlapping the plural specular reflection light filters with each other.

8. A defect inspection method comprising:

a light-emitting step of emitting a laser beam from a light source;

a first light-condensing step of linearly condensing the laser beam emitted in the light-emitting step;

an irradiation step of allowing the illumination light linearly condensed in the first light-condensing step to pass through a pupil surface of an objective lens and to reach onto a sample;

an irradiation position controlling step of controlling an irradiation position on the sample in the irradiation step to control a passing position of the illumination light on the pupil surface;

a second light-condensing step of condensing light irradiated in the irradiation step and generated from the sample;

a specular reflection light-blocking step of blocking specular reflection light from the sample and light components generated near the pupil surface among the light beams condensed in the second light-condensing step;

an image forming step of imaging the light that is condensed in the second light-condensing step and that is not blocked in the specular reflection light-blocking step into a detector; and

a defect determination step of detecting a defect on a surface of the sample on the basis of a signal of the image imaged in the image forming step;

wherein a spatial filter is disposed on the pupil surface of the objective lens, and an illumination mirror is disposed at a position apart from the spatial filter by a predetermination distance; and

wherein the spatial filter and the illumination mirror include angle rotation mechanisms.