IP Library Granted Patent US 8,036,845
Granted Patent B2
US 8,036,845 · App. 12/792,795 · Granted Oct 11, 2011

Method of correcting coordinates, and defect review apparatus

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Quick Facts
Patent No.
US 8,036,845
App. No.
12/792,795
Granted
Oct 11, 2011
Kind
B2
Abstract

The present invention provides a method of correcting coordinates so as to quickly and properly arrange a sample in a field of view in a review apparatus for moving a sample stage onto the specified coordinates to review the sample. A review apparatus according to the present invention, which is a review apparatus for moving a sample stage onto coordinates previously calculated by a checking apparatus to review the sample, has a function of retaining a plurality of coordinate correction tables to correct a deviation between a coordinate value previously calculated by a checking apparatus and an actual sample position detected by the review apparatus. The review apparatus evaluates correction accuracy of the plurality of coordinate correction tables and applies one of the coordinate correction tables with the maximum evaluation value.

Claims (13)

1. A review apparatus provided with an automatic defect review (ADR) function in which a high magnification defect image is automatically obtained based on positional information of a defect detected by an outer inspection apparatus, comprising:

a storage device for storing a plurality of coordinate correction tables for correcting a deviation between coordinate values of the defect obtained by the outer inspection apparatus and by the review apparatus, respectively;

a central control unit for switching said plurality of coordinate correction tables to an optimal coordinate correction table in executing said ADR; and

a display for displaying an evaluation result of the plurality of coordinate correction tables,

wherein a selection box for selecting the plurality of coordinate correction tables and a defect map showing a tendency of the deviation corresponding to the selection box are displayed as the evaluation result.

2. The review apparatus according to claim 1 , wherein said central control unit updates content of the coordinate correction tables after the end of the execution of said ADR.

3. A review apparatus for obtaining a defect image of a sample automatically based on positional information of a defect detected by an outer inspection apparatus, comprising:

a storage device for storing a plurality of coordinate correction tables for determining a coordinate value for obtaining the defect image based on a coordinate value of the defect obtained by the outer inspection apparatus;

a central control unit for switching said plurality of coordinate correction tables in parallel to review of the sample; and

a display for displaying an evaluation result of the plurality of coordinate correction tables,

wherein a selection box for selecting the plurality of coordinate correction tables and a defect map showing a tendency of the deviation between coordinate values of the defect obtained by the outer inspection apparatus and by the review apparatus corresponding to the selection box are displayed.

4. The review apparatus according to claim 3 , wherein said central control unit evaluates correction accuracy of the plurality of coordinate correction tables in parallel to the review.

5. The review apparatus according to claim 3 , wherein said central control unit sets one of coordinate correction tables evaluated as appropriate among the plurality of coordinate correction tables to an initial coordinate correction table for next review.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →