Mass spectrometer
View Patent ↗A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
1. A mass spectrometer comprising:
an ionization source for generating ions;
an ion trap for accumulating said ions, wherein a gas is introduced into said ion trap;
a time-of-flight mass spectrometer for performing mass spectrometry analysis on said ions by use of a flight time;
a collision damping chamber disposed between said ion trap and said time-of-flight mass spectrometer and having a plurality of electrodes therein which produce a multi-pole electric field, a gas being introduced into said collision damping chamber; and
an ion stop electrode provided between said ion trap and said collision damping chamber;
wherein a voltage for allowing the passage of ions is applied to said ion stop electrode during a period of ion ejection from said ion trap, and a voltage for blocking the passage of ions is applied to said ion stop electrode during a period of at least one of ion accumulation, ion isolation and ion dissociation in said ion trap so that the ions from said ion trap are prevented from entering into said collision damping chamber;
wherein a gas supply mechanism is provided for each of said ion trap and said collision damping chamber.
2. The mass spectrometer as claimed in claim 1 , wherein said ion trap is a three-dimensional quadrupole ion trap made up of a ring electrode and a pair of endcap electrodes.
3. The mass spectrometer as claimed in claim 1 , wherein said gas introduced into said collision damping chamber is helium; and a product of a pressure and a length of said collision damping chamber is between 0.2 Pa*m and 6 Pa*m.
4. The mass spectrometer as claimed in claim 1 , wherein said gas introduced into said collision damping chamber is Ar, air, or nitrogen, or a mixture thereof; and a product of a pressure and a length of said collision damping chamber is between 0.07 Pa*m and 2 Pa*m.
5. The mass spectrometer as claimed in claim 1 , wherein said plurality of electrodes in said collision damping chamber which produce said multi-pole electric field are 4, 6, or 8 rods; and a radio frequency voltage is alternately applied to said 4, 6, or 8 rods.
6. The mass spectrometer as claimed in claim 1 , wherein said ionization source is disposed such that it is under atmospheric pressure.
7. The mass spectrometer as claimed in claim 1 , wherein said ionization source is a laser ionization source.
8. The mass spectrometer as claimed in claim 7 , wherein said ionization source is a matrix assisted laser ionization source.
9. The mass spectrometer as claimed in claim 1 , wherein the voltage for blocking the passage of the ions is between a few hundred volts and a few thousand volts.
10. The mass spectrometer as claimed in claim 1 , wherein a trapping potential for trapping the ions in said ion trap is applied to said ion trap.
11. The mass spectrometer as claimed in claim 1 , wherein a gas pressure in said collision damping chamber is higher than a gas pressure in said ion trap.