IP Library Granted Patent US 6,977,373
Granted Patent B2
US 6,977,373 · App. 10/846,529 · Granted Dec 20, 2005

Ion trap mass analyzing apparatus

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Quick Facts
Patent No.
US 6,977,373
App. No.
10/846,529
Granted
Dec 20, 2005
Kind
B2
Abstract

An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.

Claims (20)

1. An ion-trap mass analyzing apparatus comprising:

an annular ring electrode,

an inlet side end cap electrode which has an ion inlet aperture and an outlet side end cap electrode wherein said ion outlet aperture and said outlet side end cap electrode are opposed to each other so as to sandwich said ring electrode,

a first voltage power supply for applying voltage to said ring electrode, and

a second voltage power supply for applying voltage to said inlet side end cap electrode and outlet side end cap electrode,

wherein said inlet side end cap electrode and said outlet side electrode are formed asymmetrically with respect to a reference plane, and

wherein an absolute value of voltage applied to said inlet side end cap electrode and an absolute value of voltage applied to said outlet side end cap electrode are substantially equal.

2. An ion-trap mass analyzing apparatus according to claim 1 ,

wherein the diameter of said ion inlet aperture is larger than the diameter of said ion outlet aperture.

3. An ion-trap mass analyzing apparatus according to claim 1 ;

wherein the distance from said reference plane to said inlet side end cap electrode is longer than the distance from said reference plane to said outlet side end cap electrode.

4. An ion-trap mass analyzing apparatus comprising:

an annular ring electrode,

an inlet side end cap electrode which has an ion inlet aperture and an outlet side end cap electrode wherein said ion outlet aperture and said outlet side end cap electrode are opposed to each other so as to sandwich said ring electrode,

a first voltage power supply for applying voltage to said ring electrode;

a second voltage power supply for applying voltage to said inlet side end cap electrode and outlet side end cap electrode;

wherein an absolute value of voltage applied to said inlet side end cap electrode and an absolute value of voltage applied to said outlet side end cap electrode are substantially equal, and

wherein said apparatus further includes a function for switching electric field distribution among said inlet side end cap electrode, said outlet side end cap electrode and said ring electrode, from an asymmetrical electric field distribution to a symmetrical electric field distribution.

5. An ion-trap mass analyzing apparatus according to claim 4 ,

wherein said inlet side end cap electrode and said outlet side end cap electrode are formed asymmetrically with respect to a reference plane.

Assignments (1)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →