Pattern measurement device and computer program for evaluating patterns based on centroids of the patterns

1. A pattern measurement device comprising:

a calculation device that measures a dimension between patterns formed in a sample, by using data which is obtained by irradiating the sample with a beam,

wherein

the calculation device

obtains centroids of a plurality of patterns contained in the data;

obtains at least one of an inter-centroid distance of the plurality of patterns, angle information of imaginary lines which link the plurality of centroids to each other, and area information of a closed shape formed by the imaginary lines; and

distinguishes at least one of a pattern which meets a specific condition, an area including the pattern which meets the specific condition, and an imaginary line between patterns meeting the specific condition, from at least one of a pattern different from the pattern which meets the specific condition, an area other than the area including the pattern which meets the specific condition, and an imaginary line between patterns other than the patterns meeting the specific condition, on the basis of at least one of the inter-centroid distance, the angle information, and the area information which have been obtained, or

calculates information regarding at least one of the number of patterns meeting the specific condition, a size of the area including the patterns which meet the specific condition, and the number of imaginary lines between the patterns meeting specific condition.

2. The pattern measurement device according to claim 1 , wherein

the pattern is formed by self-assembly of molecules.

3. The pattern measurement device according to claim 1 , wherein

the calculation device obtains the centroid on the basis of an edge or contour line information of the pattern.

4. The pattern measurement device according to claim 1 , wherein

the calculation device obtains at least one of a relative angle between the imaginary lines and a reference line functioning as a reference, and a relative angle between the imaginary lines, as the angle information.

5. The pattern measurement device according to claim 1 , wherein

the calculation device obtains an area difference between a reference figure and the closed shape formed by the imaginary lines.

6. The pattern measurement device according to claim 1 , further comprising:

a display device that distinguishes and displays at least one of the pattern meeting the specific condition, the area including the pattern which meet the specific condition, and the imaginary line between the patterns meeting the specific condition, from at least one of the pattern other than the pattern meeting the specific condition, the area different from the area including the pattern which meet the specific condition, and the imaginary line between the patterns other than the patterns meeting the specific condition.

7. The pattern measurement device according to claim 1 , further comprising:

a display device that displays at least one of the inter-centroid distance of the plurality of patterns, the angle information of imaginary lines which link the plurality of centroids, and the area information of the closed shape formed by the imaginary lines.

8. The pattern measurement device according to claim 1 , further comprising:

a display device that displays distribution of at least one of the inter-centroid distance of the plurality of patterns, the angle information of imaginary lines which link the plurality of centroids, and the area information of the closed shape formed by the imaginary lines, in accordance with a value of the at least one.

9. The pattern measurement device according to claim 1 , further comprising:

a display device that distinguishes and displays at least one of the pattern meeting the specific condition, the area including the pattern meeting the specific condition, and the imaginary line between the patterns meeting specific condition, from at least one of the pattern different from the pattern meeting the specific condition, the area other than the area including the pattern meeting the specific condition, and the imaginary line between the patterns other than the patterns meeting the specific condition.

10. The pattern measurement device according to claim 1 , wherein

the calculation device performs grouping of at least one of the patterns meeting specific condition, and the imaginary lines between the patterns meeting specific condition.

11. A non-transitory computer-readable medium storing a program causing a computer to measure dimensions between patterns formed in a sample, by using data which is obtained by irradiating the sample with a beam,

wherein

the program causes the computer to:

obtain centroids of a plurality of patterns contained in the data;

obtain at least one of an inter-centroid distance of the plurality of patterns, angle information of imaginary lines which link the plurality of centroids to each other, and area information of a closed shape formed by the imaginary lines; and

distinguish at least one of a pattern which meets a specific condition, an area including the pattern which meets the specific condition, and an imaginary line between patterns meeting the specific condition, from at least one of a pattern different from the pattern which meets the specific condition, an area other than the area including the pattern which meets the specific condition, and an imaginary line between patterns other than the patterns meeting the specific condition, on the basis of at least one of the inter-centroid distance, the angle information, and the area information which have been obtained, or

calculate information regarding at least one of the number of patterns meeting the specific condition, a size of the area including the pattern which meet the specific condition, and the number of imaginary lines between the patterns meeting the specific condition.