Apparatus and method for specimen fabrication
View Patent ↗A specimen fabricating apparatus comprises: a specimen stage, on which a specimen is placed; a charged particle beam optical system to irradiate a charged particle beam on the specimen; an etchant material supplying source to supply an etchant material, which contains fluorine and carbon in molecules thereof, does not contain oxygen in molecules thereof, and is solid or liquid in a standard state; and a vacuum chamber to house therein the specimen stage. A specimen fabricating method comprises the steps of: processing a hole in the vicinity of a requested region of a specimen by means of irradiation of a charged particle beam; exposing the requested region by means of irradiation of the charged particle beam; supplying an etchant material, which contains fluorine and carbon in molecules thereof, does not contain oxygen in molecules thereof, and is solid or liquid in a standard state, to the requested region as exposed; and irradiating the charged particle beam on the requested region as exposed.
1. A specimen fabricating apparatus comprising:
a specimen stage on which a specimen is placed;
a charged particle beam optical system to irradiate a charged particle beam onto the specimen;
a probe to extract a micro-sample separated from the specimen by irradiating the charged particle beam onto the specimen; and
an etchant material supplying source to supply an etchant material, which contains fluorine and carbon in molecules thereof, does not contain oxygen in molecules thereof, and is a solid or a liquid in a standard state.
2. The specimen fabricating apparatus according to claim 1 , further comprising a sample-carrier on which the micro-sample is placed, and a unit for inclining the sample-carrier.
3. The specimen fabricating apparatus according to claim 1 , wherein the etchant material is F(CF 2 ) 12 F, (CF 2 ) 15 F 3 N, or I(CF 2 ) 8 I.
4. The specimen fabricating apparatus according to claim 1 , wherein the etchant material supplying source has a cartridge type construction which enables exchange of the etchant material.
5. The specimen fabricating apparatus according to claim 4 , further comprising a cartridge holder to fix the cartridge, and wherein the cartridge holder comprises means to heat the cartridge.
6. A specimen fabricating apparatus comprising:
a specimen stage on which a specimen is placed;
a charged particle beam optical system to irradiate a charged particle beam onto a specimen;
a probe to extract a micro-sample separated from the specimen by irradiating the charged particle beam onto the specimen; and
an etchant material supplying source to supply an etchant material, in molecules of which a ratio of fluorine to carbon in number is 2 or more and which is a solid or a liquid in a standard state, to the specimen.
7. The specimen fabricating apparatus according to claim 6 , further comprising a sample carrier on which the micro-sample is placed, and a unit for inclining the sample-carrier.
8. The specimen fabricating apparatus according to claim 6 , wherein the etchant material is F(CF 2 ) 12 F, (CF 2 ) 15 F 3 N, or I(CF 2 ) 8 I.
9. A specimen fabricating apparatus comprising:
a specimen stage on which a specimen is placed;
an ion-beam irradiating optical system to irradiate an ion-beam, onto the specimen;
an electron beam irradiating optical system to irradiate an electron beam onto the specimen;
an etchant material supplying source to supply an etchant material, which contains fluorine and carbon in molecules thereof, does not contain oxygen in molecules thereof, and is a solid or a liquid in a standard state; and
a vacuum chamber to house the specimen stage, the ion-beam irradiating optical system and the electron beam irradiating optical system.
10. The specimen fabricating apparatus according to claim 9 , wherein the electron beam irradiating optical system is obliquely provided relative to the specimen stage.
11. The specimen fabricating apparatus according to claim 9 , further comprising a probe to extract a micro-sample separated from the specimen by irradiating the ion-beam on the specimen and a probe rotating mechanism to rotate the probe.
12. The specimen fabricating apparatus according to claim 9 , wherein the etchant material is composed of molecules, of which a ratio of fluorine to carbon in number is 2 or more, and is a solid or a liquid in a standard state.
13. The specimen fabricating apparatus according to claim 9 , wherein the etchant material is F(CF 2 ) 12 F, (CF 2 ) 15 F 3 N, or I(CF 2 ) 8 I.
14. A specimen fabricating apparatus comprising:
a specimen stage on which a specimen is placed;
an ion-beam irradiating optical system to irradiate an ion-beam onto the specimen;
a probe to extract a micro-sample separated from the specimen by irradiating the ion-beam onto the specimen;
an electron beam irradiating optical system to irradiate an electron beam onto the micro-sample;
an etchant material supplying source to supply an etchant material for decorating a section of the micro-sample; and
a vacuum chamber to house the specimen stage, the ion-beam irradiating optical system and the electron beam irradiating optical system,
wherein the etchant material is composed of molecules, of which a ratio of fluorine to carbon in number is 2 or more, and is a solid or a liquid in a standard state.
15. The specimen fabricating apparatus according to claim 14 , wherein the electron beam irradiating optical system can irradiate the electron beam on the micro-sample perpendicularly to the section.
16. The specimen fabricating apparatus according to claim 14 , further comprising a probe rotating mechanism to rotate the probe.
17. The specimen fabricating apparatus according to claim 14 , wherein the etchant material contains fluorine and carbon in molecules thereof, does not contain oxygen in molecules thereof, and is a solid or a liquid in a standard state.