Far-infrared imaging device and far-infrared imaging method
View Patent ↗Provided are an imaging method and device for imaging using far infrared light that make it possible to quickly image a subject without producing damage or a non-linear phenomenon in the subject. A variable-frequency coherent light source is used, illumination light from the light source is irradiated onto a linear area on an imaging subject, transmitted or reflected light is used to form an image of the imaging subject, a non-linear optical crystal is used for wavelength conversion, and a one-dimensional or two-dimensional array sensor is used to image the imaging subject while the imaging subject is moved in at least one direction.
1. A far-infrared imaging apparatus, comprising:
a wavelength-tunable far-infrared light source;
an illumination optical system for irradiating a specimen with far-infrared light;
a far-infrared light imaging optical system for forming an image of the specimen;
a non-linear optical crystal for detection being arranged in the vicinity of an image plane of the far-infrared light imaging optical system;
an array sensor;
a detection optical system for introducing light emitted from the non-linear optical crystal for detection onto the array sensor; and
a stage for placing the specimen, the stage being movable in at least one direction, wherein
the wavelength-tunable far-infrared light source comprises: two near infrared light sources each having wavelengths different from each other; and a non-linear crystal onto which light oscillating from the near infrared light source is incident, the wavelength-tunable far-infrared light source being a light source that generates far-infrared light from a linear area by parametric generation, and
the illumination optical system is an afocal optical system, that includes at least two optical elements, in which a rear focal plane of one of the optical elements matches with a front focal plane of another one of the optical elements, and that images far-infrared light emitting from the linear area of the wavelength-tunable far-infrared light source.
2. The far-infrared imaging apparatus according to claim 1 , wherein
one of the near infrared light sources irradiates a beam that passes through the non-linear crystal approximately in parallel to a side surface of the non-linear crystal, and
the non-linear crystal includes a Si prism that extracts far-infrared light from the side surface.
3. The far-infrared imaging apparatus according to claim 1 , wherein
the far-infrared imaging optical system includes at least two lenses, and
a side of the specimen of the far-infrared imaging optical system is a one-side object telecentric imaging optical system, or the far-infrared imaging optical system is a double telecentric imaging optical system.
4. The far-infrared imaging apparatus according to claim 3 , wherein
in a first cross section along the region on the line, the detection optical system images a portion around an emission surface of the non-linear optical crystal for detection on the array sensor.
5. The far-infrared imaging apparatus according to claim 4 , wherein
the detection optical system includes at least two lenses, and
at least the detection non-linear optical crystal side of the detection optical system is telecentric in the first cross section.
6. The far-infrared imaging apparatus according to claim 3 , wherein
in a second cross section orthogonal to the region on the line, the detection optical system concentrates light emitted from the non-linear optic for detection on the array sensor.
7. The far-infrared imaging apparatus according to claim 6 , wherein
in the second cross section, the detection optical system images the portion around the emission surface of the non-linear optical crystal for detection on the array sensor.